Automatic functional test generation using the extended finite state machine model
DAC '93 Proceedings of the 30th international Design Automation Conference
Architecture validation for processors
ISCA '95 Proceedings of the 22nd annual international symposium on Computer architecture
An observability-based code coverage metric for functional simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
DAC '98 Proceedings of the 35th annual Design Automation Conference
Functional vector generation for HDL models using linear programming and 3-satisfiability
DAC '98 Proceedings of the 35th annual Design Automation Conference
The Verilog hardware description language (4th ed.)
The Verilog hardware description language (4th ed.)
VIS: A System for Verification and Synthesis
CAV '96 Proceedings of the 8th International Conference on Computer Aided Verification
Automatic test pattern generation for functional RTL circuits using assignment decision diagrams
Proceedings of the 37th Annual Design Automation Conference
Automatic test bench generation for validation of RT-level descriptions: an industrial experience
DATE '00 Proceedings of the conference on Design, automation and test in Europe
A VHDL error simulator for functional test generation
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Functional test generation for behaviorally sequential models
Proceedings of the conference on Design, automation and test in Europe
A data flow fault coverage metric for validation of behavioral HDL descriptions
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
RT-Level ITC'99 Benchmarks and First ATPG Results
IEEE Design & Test
Automatic Validation of Protocol Interfaces Described in VHDL
Real-World Applications of Evolutionary Computing, EvoWorkshops 2000: EvoIASP, EvoSCONDI, EvoTel, EvoSTIM, EvoROB, and EvoFlight
ARPIA: A High-Level Evolutionary Test Signal Generator
Proceedings of the EvoWorkshops on Applications of Evolutionary Computing
Coverage Metrics for Temporal Logic Model Checking
TACAS 2001 Proceedings of the 7th International Conference on Tools and Algorithms for the Construction and Analysis of Systems
Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
FME '01 Proceedings of the International Symposium of Formal Methods Europe on Formal Methods for Increasing Software Productivity
A Practical Approach to Coverage in Model Checking
CAV '01 Proceedings of the 13th International Conference on Computer Aided Verification
A Domain Coverage Metric for the Validation of Behavioral VHDL Descriptions
ITC '00 Proceedings of the 2000 IEEE International Test Conference
AMLETO: A Multi-language Environment for Functional Test Generation
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Validation Fault Model for Timing-Induced Functional Errors
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test
A Probabilistic Method for the Computation of Testability of RTL Constructs
Proceedings of the conference on Design, automation and test in Europe - Volume 1
High-level test generation for hardware testing and software validation
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
A framework for the functional verification of systemC models
International Journal of Parallel Programming
An efficient evaluation and vector generation method for observability-enhanced statement coverage
Journal of Computer Science and Technology
VFSim: concurrent fault simulation at register transfer level
Journal of Computer Science and Technology
Coverage metrics for temporal logic model checking
Formal Methods in System Design
MMV: a metamodeling based microprocessor validation environment
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Fast enhancement of validation test sets for improving the stuck-at fault coverage of RTL circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Coverage-directed observability-based validation for embedded software
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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