A Validation Fault Model for Timing-Induced Functional Errors

  • Authors:
  • Qiushuang Zhang;Ian G. Harris

  • Affiliations:
  • -;-

  • Venue:
  • ITC '01 Proceedings of the 2001 IEEE International Test Conference
  • Year:
  • 2001

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Abstract

The violation of timing constraints on signals withina complex system can create timing-induced functionalerrors which alter the value of output signals. Theseerrors are not detected by traditional functionalvalidation approaches because functional validationdoes not consider signal timing. Timing-inducedfunctional errors are also not detected by traditionaltiming analysis approaches because the errors mayaffect output data values without affecting output signaltiming. A timing fault model, the Mis-Timed Event(MTE) fault model, is proposed to model timing-inducedfunctional errors. The MTE fault modelformulates timing errors in terms of their effects onthe lifespans of the signal values associated with thefault. We use several examples to evaluate the MTEfault model. MTE fault coverage results shows that itefficiently captures an important class of errors whichare not targeted by other metrics.