The practical SQL handbook: using structured query language
The practical SQL handbook: using structured query language
The craft of software testing: subsystem testing including object-based and object-oriented testing
The craft of software testing: subsystem testing including object-based and object-oriented testing
Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Code generation and analysis for the functional verification of micro processors
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Discovering data mining: from concept to implementation
Discovering data mining: from concept to implementation
Compacting regression-suites on-the-fly
APSEC '97 Proceedings of the Fourth Asia-Pacific Software Engineering and International Computer Science Conference
Symbolic functional vector generation for VHDL specifications
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A methodology for the verification of a “system on chip”
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
DIVA: a reliable substrate for deep submicron microarchitecture design
Proceedings of the 32nd annual ACM/IEEE international symposium on Microarchitecture
An RTL Abstraction Technique for Processor MicroarchitectureValidation and Test Generation
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Hole analysis for functional coverage data
Proceedings of the 39th annual Design Automation Conference
Coverage Metrics for Functional Validation of Hardware Designs
IEEE Design & Test
Solving the generalized mask constraint for test generation of binary floating point add operation
Theoretical Computer Science - Real numbers and computers
A Fault Tolerant Approach to Microprocessor Design
DSN '01 Proceedings of the 2001 International Conference on Dependable Systems and Networks (formerly: FTCS)
Coverage-oriented verification of banias
Proceedings of the 40th annual Design Automation Conference
Coverage directed test generation for functional verification using bayesian networks
Proceedings of the 40th annual Design Automation Conference
A Domain Coverage Metric for the Validation of Behavioral VHDL Descriptions
ITC '00 Proceedings of the 2000 IEEE International Test Conference
A Validation Fault Model for Timing-Induced Functional Errors
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Cost Evaluation of Coverage Directed Test Generation for the IBM Mainframe
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test
A BNF-based automatic test program generator for compatible microprocessor verification
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Stimuli Generation with Late Binding of Values
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Industrial experience with test generation languages for processor verification
Proceedings of the 41st annual Design Automation Conference
Defining coverage views to improve functional coverage analysis
Proceedings of the 41st annual Design Automation Conference
Systematic functional coverage metric synthesis from hierarchical temporal event relation graph
Proceedings of the 41st annual Design Automation Conference
Probabilistic regression suites for functional verification
Proceedings of the 41st annual Design Automation Conference
Functional verification of the z990 superscalar, multibook microprocessor complex
IBM Journal of Research and Development
Cross-Product Functional Coverage Measurement with Temporal Properties-Based Assertions
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Aspect language features for concern coverage profiling
Proceedings of the 4th international conference on Aspect-oriented software development
A generic micro-architectural test plan approach for microprocessor verification
Proceedings of the 42nd annual Design Automation Conference
FPgen - a test generation framework for datapath floating-point verification
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
FSM-based transaction-level functional coverage for interface compliance verification
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Practical methods in coverage-oriented verification of the merom microprocessor
Proceedings of the 43rd annual Design Automation Conference
Advanced Analysis Techniques for Cross-Product Coverage
IEEE Transactions on Computers
All code coverage is not created equal: a case study in prioritized code coverage
CASCON '06 Proceedings of the 2006 conference of the Center for Advanced Studies on Collaborative research
Proceedings of the conference on Design, automation and test in Europe
A framework for the validation of processor architecture compliance
Proceedings of the 44th annual Design Automation Conference
Evaluating Workloads Using Comparative Functional Coverage
HVC '08 Proceedings of the 4th International Haifa Verification Conference on Hardware and Software: Verification and Testing
Advanced code coverage analysis using substring holes
Proceedings of the eighteenth international symposium on Software testing and analysis
The advantages of post-link code coverage
HVC'07 Proceedings of the 3rd international Haifa verification conference on Hardware and software: verification and testing
Evaluating workloads using multi-comparative functional coverage
HVC'09 Proceedings of the 5th international Haifa verification conference on Hardware and software: verification and testing
An automatic coverage analysis for systemc using UML and aspect-oriented technology
CSCWD'04 Proceedings of the 8th international conference on Computer Supported Cooperative Work in Design I
Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification
Journal of Electronic Testing: Theory and Applications
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This paper describes a new coverage methodology developed at IBM's Haifa Research Lab. The main idea behind the methodology is a separation of the coverage model definition from the coverage analysis tool. This enables the user to define the coverage models that best fit the points of significance in the design, and still have the benefits of a coverage tool. To support this methodology, we developed a new coverage measurement tool called Comet. The tool is currently used in many domains, such as system verification and micro-architecture verification, and in many types of designs ranging from systems, to microprocessors, and ASICs.