Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
User defined coverage—a tool supported methodology for design verification
DAC '98 Proceedings of the 35th annual Design Automation Conference
Functional verification methodology for microprocessors using the Genesys test-program generator
DATE '99 Proceedings of the conference on Design, automation and test in Europe
A relational model of data for large shared data banks
Communications of the ACM
High quality behavioral verification using statistical stopping criteria
Proceedings of the conference on Design, automation and test in Europe
Hole analysis for functional coverage data
Proceedings of the 39th annual Design Automation Conference
Coverage directed test generation for functional verification using bayesian networks
Proceedings of the 40th annual Design Automation Conference
Defining coverage views to improve functional coverage analysis
Proceedings of the 41st annual Design Automation Conference
A generic micro-architectural test plan approach for microprocessor verification
Proceedings of the 42nd annual Design Automation Conference
FPgen - a test generation framework for datapath floating-point verification
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Enhancing the control and efficiency of the covering process [logic verification]
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Evaluating Workloads Using Comparative Functional Coverage
HVC '08 Proceedings of the 4th International Haifa Verification Conference on Hardware and Software: Verification and Testing
Advanced code coverage analysis using substring holes
Proceedings of the eighteenth international symposium on Software testing and analysis
Evaluating workloads using multi-comparative functional coverage
HVC'09 Proceedings of the 5th international Haifa verification conference on Hardware and software: verification and testing
Reaching coverage closure in post-silicon validation
HVC'10 Proceedings of the 6th international conference on Hardware and software: verification and testing
HVC'11 Proceedings of the 7th international Haifa Verification conference on Hardware and Software: verification and testing
| Hi-index | 14.98 |
Coverage analysis is used to monitor the quality of the verification process. Reports provided by coverage tools help users identify areas in the design that have not been adequately tested. Because of their sheer size, the analysis of large coverage models can be an intimidating and time-consuming task. This paper presents several techniques for coverage analysis. These techniques range from highly interactive and dynamic analysis that allows users to focus on certain aspects or areas of interest in the coverage model to fully automated coverage analysis, which identifies uncovered or lightly covered areas. The proposed techniques provide additional means for extracting relevant, useful information, thereby improving the quality of the coverage analysis. A number of examples show how the proposed method improved the verification of actual designs.