FPgen - a test generation framework for datapath floating-point verification

  • Authors:
  • M. Aharoni;S. Asaf;L. Fournier;A. Koifman;R. Nagel

  • Affiliations:
  • IBM Haifa Res. Labs., Israel;IBM Haifa Res. Labs., Israel;IBM Haifa Res. Labs., Israel;IBM Haifa Res. Labs., Israel;IBM Haifa Res. Labs., Israel

  • Venue:
  • HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
  • Year:
  • 2003

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Abstract

FPgen is a new test generation framework targeted toward the verification of the floating point (FP) datapath, through the generation of test cases. This framework provides the capacity to define virtually any architectural FP coverage model, consisting of verification tasks. The tool supplies strong constraint solving capabilities, allowing the generation of random tests that target these tasks. We present an overview of FPgen's functionality, describe the results of its use for the verification of several FP units, and compare its efficiency with existing test generators.