Guest Editors' Introduction: Microprocessor Test and Verification
IEEE Design & Test
Processor Models for Retargetable Tools
RSP '00 Proceedings of the 11th IEEE International Workshop on Rapid System Prototyping (RSP 2000)
FPgen - a test generation framework for datapath floating-point verification
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Specification-driven directed test generation for validation of pipelined processors
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Generating test programs to cover pipeline interactions
Proceedings of the 46th Annual Design Automation Conference
Programming and Computing Software
TACAS'08/ETAPS'08 Proceedings of the Theory and practice of software, 14th international conference on Tools and algorithms for the construction and analysis of systems
Reconfigurable Model-Based Test Program Generator for Microprocessors
ICSTW '11 Proceedings of the 2011 IEEE Fourth International Conference on Software Testing, Verification and Validation Workshops
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Development of test programs and analysis of the results of their execution is the basic approach to verification of microprocessors at the system level. There is a variety of methods for the automation of test generation, starting with the generation of random code and ending with directed model-based test generation. However, there is no cure-all method. In practice, combinations of various complementary techniques are used. Unfortunately, no solution for the integration of various test generation methods into a unified environment is currently available. To test a microprocessor, verification engineers are forced to use many different test generators, which results in a number of difficulties, such as (1) the necessity to ensure the compatibility of tool configurations (in each tool, a specific description of the target microprocessor is used, which leads to duplication of information); (2) the necessity to develop utilities for integration tools (different tools have different interfaces and use different data formats). This paper describes a concept of extensible environment for test program generation for microprocessors. This environment provides a unified approach for test generation; it supports widespread test generation techniques, and can be extended by new testing tools. The proposed concept was partially implemented in MicroTESK (Microprocessor T Esting and Specification Kit).