Probabilistic reasoning in intelligent systems: networks of plausible inference
Probabilistic reasoning in intelligent systems: networks of plausible inference
Real-world applications of Bayesian networks
Communications of the ACM
User defined coverage—a tool supported methodology for design verification
DAC '98 Proceedings of the 35th annual Design Automation Conference
Functional verification methodology for microprocessors using the Genesys test-program generator
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Micro architecture coverage directed generation of test programs
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Writing testbenches: functional verification of HDL models
Writing testbenches: functional verification of HDL models
Probabilistic Networks and Expert Systems
Probabilistic Networks and Expert Systems
Learning Dynamic Bayesian Networks
Adaptive Processing of Sequences and Data Structures, International Summer School on Neural Networks, "E.R. Caianiello"-Tutorial Lectures
Cost evaluation of coverage directed test generation for the IBM mainframe
Proceedings of the IEEE International Test Conference 2001
A Functional Validation Technique: Biased-Random Simulation Guided by Observability-Based Coverage
ICCD '01 Proceedings of the International Conference on Computer Design: VLSI in Computers & Processors
A BNF-based automatic test program generator for compatible microprocessor verification
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Defining coverage views to improve functional coverage analysis
Proceedings of the 41st annual Design Automation Conference
Systematic functional coverage metric synthesis from hierarchical temporal event relation graph
Proceedings of the 41st annual Design Automation Conference
Probabilistic regression suites for functional verification
Proceedings of the 41st annual Design Automation Conference
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
StressTest: an automatic approach to test generation via activity monitors
Proceedings of the 42nd annual Design Automation Conference
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Enhancing the control and efficiency of the covering process [logic verification]
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Depth-driven verification of simultaneous interfaces
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Priority directed test generation for functional verification using neural networks
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Functional test generation using property decompositions for validation of pipelined processors
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Testing software modelling tools using data mutation
Proceedings of the 2006 international workshop on Automation of software test
Software-based self-testing of microprocessors
Journal of Systems Architecture: the EUROMICRO Journal
Practical methods in coverage-oriented verification of the merom microprocessor
Proceedings of the 43rd annual Design Automation Conference
Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation
IEEE Transactions on Computers
Advanced Analysis Techniques for Cross-Product Coverage
IEEE Transactions on Computers
Interactive presentation: Functional and timing validation of partially bypassed processor pipelines
Proceedings of the conference on Design, automation and test in Europe
A Survey of Hybrid Techniques for Functional Verification
IEEE Design & Test
State space exploration using feedback constraint generation and Monte-Carlo sampling
Proceedings of the the 6th joint meeting of the European software engineering conference and the ACM SIGSOFT symposium on The foundations of software engineering
Active sampling for multiple output identification
Machine Learning
Specification-driven directed test generation for validation of pipelined processors
ACM Transactions on Design Automation of Electronic Systems (TODAES)
A probabilistic alternative to regression suites
Theoretical Computer Science
Towards Automating Simulation-Based Design Verification Using ILP
Inductive Logic Programming
Improving functional verification of embedded systems using hierarchical composition and set theory
Proceedings of the 2009 ACM symposium on Applied Computing
Automatic Boosting of Cross-Product Coverage Using Bayesian Networks
HVC '08 Proceedings of the 4th International Haifa Verification Conference on Hardware and Software: Verification and Testing
Functional test generation using design and property decomposition techniques
ACM Transactions on Embedded Computing Systems (TECS)
Design validation of multithreaded architectures using concurrent threads evolution
Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes
Concurrent Java Test Generation as a Search Problem
Electronic Notes in Theoretical Computer Science (ENTCS)
Using virtual coverage to hit hard-to-reach events
HVC'07 Proceedings of the 3rd international Haifa verification conference on Hardware and software: verification and testing
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Causal networks for risk and compliance: methodology and application
IBM Journal of Research and Development
A framework for testing hardware-software security architectures
Proceedings of the 26th Annual Computer Security Applications Conference
A probabilistic analysis of coverage methods
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Learning microarchitectural behaviors to improve stimuli generation quality
Proceedings of the 48th Design Automation Conference
Journal of Electronic Testing: Theory and Applications
Coverage-Directed Test Generation Automated by Machine Learning -- A Review
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Active sampling for multiple output identification
COLT'06 Proceedings of the 19th annual conference on Learning Theory
EmGen: an automatic test-program generation tool for embedded IP cores
ICESS'04 Proceedings of the First international conference on Embedded Software and Systems
Online selection of effective functional test programs based on novelty detection
Proceedings of the International Conference on Computer-Aided Design
ESL Design and Verification: A Prescription for Electronic System Level Methodology
ESL Design and Verification: A Prescription for Electronic System Level Methodology
Targeted random test generation for power-aware multicore designs
ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on verification challenges in the concurrent world
Efficient self-learning techniques for SAT-based test generation
Proceedings of the eighth IEEE/ACM/IFIP international conference on Hardware/software codesign and system synthesis
Novel test detection to improve simulation efficiency: a commercial experiment
Proceedings of the International Conference on Computer-Aided Design
Manipulation of Training Sets for Improving Data Mining Coverage-Driven Verification
Journal of Electronic Testing: Theory and Applications
Simulation knowledge extraction and reuse in constrained random processor verification
Proceedings of the 50th Annual Design Automation Conference
A novel approach for implementing microarchitectural verification plans in processor designs
HVC'12 Proceedings of the 8th international conference on Hardware and Software: verification and testing
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Functional verification is widely acknowledged as the bottleneck in the hardware design cycle. This paper addresses one of the main challenges of simulation based verification (or dynamic verification), by providing a new approach for Coverage Directed Test Generation (CDG). This approach is based on Bayesian networks and computer learning techniques. It provides an efficient way for closing a feedback loop from the coverage domain back to a generator that produces new stimuli to the tested design. In this paper, we show how to apply Bayesian networks to the CDG problem. Applying Bayesian networks to the CDG framework has been tested in several experiments, exhibiting encouraging results and indicating that the suggested approach can be used to achieve CDG goals.