Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Structural Matching by Discrete Relaxation
IEEE Transactions on Pattern Analysis and Machine Intelligence
A study in coverage-driven test generation
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond
Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond
Coverage Metrics for Functional Validation of Hardware Designs
IEEE Design & Test
Coverage-Directed Test Generation Using Symbolic Techniques
FMCAD '96 Proceedings of the First International Conference on Formal Methods in Computer-Aided Design
Cost evaluation of coverage directed test generation for the IBM mainframe
Proceedings of the IEEE International Test Conference 2001
Coverage directed test generation for functional verification using bayesian networks
Proceedings of the 40th annual Design Automation Conference
Text classification using string kernels
The Journal of Machine Learning Research
Kernel Methods for Pattern Analysis
Kernel Methods for Pattern Analysis
A Framework for Constrained Functional Verification
Proceedings of the 2003 IEEE/ACM international conference on Computer-aided design
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Functional Test Selection for High Volume Manufacturing
MTV '06 Proceedings of the Seventh International Workshop on Microprocessor Test and Verification
Efficient RTL Coverage Metric for Functional Test Selection
VTS '07 Proceedings of the 25th IEEE VLSI Test Symmposium
Functional test selection based on unsupervised support vector analysis
Proceedings of the 45th annual Design Automation Conference
Coverage-directed test generation through automatic constraint extraction
HLDVT '07 Proceedings of the 2007 IEEE International High Level Design Validation and Test Workshop
Bipartite graph matching for computing the edit distance of graphs
GbRPR'07 Proceedings of the 6th IAPR-TC-15 international conference on Graph-based representations in pattern recognition
Novel test detection to improve simulation efficiency: a commercial experiment
Proceedings of the International Conference on Computer-Aided Design
Simulation knowledge extraction and reuse in constrained random processor verification
Proceedings of the 50th Annual Design Automation Conference
| Hi-index | 0.00 |
This paper proposes an online functional test selection approach based on novelty detection. Unlike other test selection methods, the idea of this paper is selecting novel functional tests to improve coverage from a large pool of available test programs before simulation. A graph based encoding scheme is developed to measure the similarity between test programs and map them into a set of feature vectors. We employ one-class SVM as the learning algorithm to detect novel tests to be simulated. While leaving the general test selection framework unchanged, the developed test program similarity measure can easily be tailored to specific applications and coverage targets based on existing simulation results. Experiments on a public domain MIPS processor design are presented to demonstrate the effectiveness of the approach.