Design Verification of the WE 32106 Math Accelerator Unit
IEEE Design & Test
Automatic generation of microprocessor test programs
DAC '82 Proceedings of the 19th Design Automation Conference
A programming language
Automatic generation of random self-checking test cases
IBM Systems Journal
IBM Systems Journal
Logic verification methodology for PowerPC microprocessors
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Functional verification of the CMOS S/390 parallel enterprise server G4 system
IBM Journal of Research and Development - Special issue: IBM S/390 G3 and G4
DAC '98 Proceedings of the 35th annual Design Automation Conference
High-level design verification of microprocessors via error modeling
ACM Transactions on Design Automation of Electronic Systems (TODAES)
High-level test generation for design verification of pipelined microprocessors
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
A methodology for the verification of a “system on chip”
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Modeling design constraints and biasing in simulation using BDDs
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Testing for Function and Performance: Towards anIntegrated Processor Validation Methodology
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
A Buffer-Oriented Methodology for Microarchitecture Validation
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Automatic Vector Generation Using Constraints and Biasing
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Postsilicon Validation Methodology for Microprocessors
IEEE Design & Test
Designing for scan test of high performance embedded memories
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Simplifying Boolean constraint solving for random simulation-vector generation
Proceedings of the 2002 IEEE/ACM international conference on Computer-aided design
Design and test of the PowerPC 603 microprocessor
EDTC '95 Proceedings of the 1995 European conference on Design and Test
A BNF-based automatic test program generator for compatible microprocessor verification
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Increased Information Flow Needs for High-Assurance Composite Evaluations
IWIA '04 Proceedings of the Second IEEE International Information Assurance Workshop (IWIA'04)
Industrial experience with test generation languages for processor verification
Proceedings of the 41st annual Design Automation Conference
IBM Journal of Research and Development
MicroGP—An Evolutionary Assembly Program Generator
Genetic Programming and Evolvable Machines
Automatic functional test program generation for microprocessor verification
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Simulation-Based Functional Test Generation for Embedded Processors
IEEE Transactions on Computers
Pseudorandom verification and emulation of an MPEG-2 transport demultiplexor
IBM Journal of Research and Development
Exploiting auto-adaptive µGP for highly effective test programs generation
ICES'03 Proceedings of the 5th international conference on Evolvable systems: from biology to hardware
Online selection of effective functional test programs based on novelty detection
Proceedings of the International Conference on Computer-Aided Design
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