Industrial experience with test generation languages for processor verification

  • Authors:
  • Michael Behm;John Ludden;Yossi Lichtenstein;Michal Rimon;Michael Vinov

  • Affiliations:
  • IBM Development Center, Austin, TX;IBM Development Center, Austin, TX;IBM Research Laboratory, Haifa, Israel;IBM Research Laboratory, Haifa, Israel;IBM Research Laboratory, Haifa, Israel

  • Venue:
  • Proceedings of the 41st annual Design Automation Conference
  • Year:
  • 2004

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Abstract

We report on our experience with a new test generation language for processor verification. The verification of two superscalar multiprocessors is described and we show the ease of expressing complex verification tasks. The cost and benefit are demonstrated: training takes up to six months; the simulation time required for a desired level of coverage has decreased by a factor of twenty; the number of escape bugs has been reduced.