Computer Arithmetic: Principles, Architecture and Design
Computer Arithmetic: Principles, Architecture and Design
Hardware description levels and test for complex circuits
DAC '81 Proceedings of the 18th Design Automation Conference
Automatic functional test program generation for microprocessors
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Taking into account asynchronous signals in functional test of complex circuits
DAC '84 Proceedings of the 21st Design Automation Conference
Functional testing techniques for digital LSI/VLSI systems
DAC '84 Proceedings of the 21st Design Automation Conference
Functional test pattern generation for integrated circuits
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
CADOC: a system for computed aided functional test
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Hardware and software tools for microprocessor functional test
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
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This paper presents an automatic generation system for behavioral test programs of microprocessors. First, the test environment is presented, as well as its consequences on test program generation. In the second part, the test principles are outlined; it is a behavioral test, i.e a test determined from the user's description of the microprocessor; the resulting test programs are quite modular. The third part presents the description language and the generation system.