Hardware and software tools for microprocessor functional test

Authors:
C. Bellon;R. Velazco
Affiliations:
Laboratoire Circuits et Systèmes, Saint Martin D'Heres Cedex, France;Laboratoire Circuits et Systèmes, Saint Martin D'Heres Cedex, France
Venue:
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Year:
1984

Citing 3
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Abstract

The GAPT project (automatic generation of test programs for microprocessors) is in its final phase. The various components of the project (method, software tools and hardware environment) are presented. A strategy to locate failures at a functional level is presented and illustred on an actual faulty circuit.