Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
Automatic generation of microprocessor test programs
DAC '82 Proceedings of the 19th Design Automation Conference
Speed up of test generation using high-level primitives
DAC '90 Proceedings of the 27th ACM/IEEE Design Automation Conference
Analysis of experimental results on functional testing and diagnosis of complex circuits
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
CADOC: a system for computed aided functional test
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Hardware and software tools for microprocessor functional test
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
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The proposed functional test method for complex circuits presents the following features: - the test problem is studied in the aggregate; a test method, a test environment and automated test program generation are proposed. - the circuit behavior is considered as a whole. including the response to instructions (or commands). and to signals at the same level. Emphasis is put on the signal test: an hardware which allows the test of signals and is compatible with functional testing is defined; a description language for signal timing diagrams is proposed.