Symbolic execution and program testing
Communications of the ACM
Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
Test strategy for microprocessers
DAC '83 Proceedings of the 20th Design Automation Conference
Taking into account asynchronous signals in functional test of complex circuits
DAC '84 Proceedings of the 21st Design Automation Conference
Hardware description levels and test for complex circuits
DAC '81 Proceedings of the 18th Design Automation Conference
Automatic generation of microprocessor test programs
DAC '82 Proceedings of the 19th Design Automation Conference
Top down design and testability of VLSI circuits
DAC '82 Proceedings of the 19th Design Automation Conference
Protection Against External Errors in a Dedicated System
IEEE Transactions on Computers
Diversified Test Methods for Local Control Units
IEEE Transactions on Computers
IEEE Transactions on Computers
Truth-Table Verification of an Iterative Logic Array
IEEE Transactions on Computers
A Functional Approach to Testing Bit-Sliced Microprocessors
IEEE Transactions on Computers
Hi-index | 0.00 |
Functional test is often the unique solution for complex circuits testing. The CADOC system supplies an adequate functional specification tool and describes the system in terms of a cooperation of functional resources. Functional tests are defined at the resource level and combined at the global level. Special attention is given to the timed expression of the test stimuli and responses.