Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
On inherent untestability of unaugmented microprogrammed control
MICRO 22 Proceedings of the 22nd annual workshop on Microprogramming and microarchitecture
Synthesis of Native Mode Self-Test Programs
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Analysis of experimental results on functional testing and diagnosis of complex circuits
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
CADOC: a system for computed aided functional test
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
| Hi-index | 0.00 |
We divide microprocessor testing into three distinct phases: verification of the control and data transfer functions; verification of the data-manipulation functions; and verification of the input-output functions. Here we deal in detail only with the first of these. To verify control, appropriate additional signals inside the chip are used and made observable at the terminal pins of the microprocessor chip. Complete instruction sequences, executed in a test mode, then serve to verify the control functions. Procedures for doing this are given and also for verifying data transfer functions.