Digital systems: hardware organization and design (3rd ed.)
Digital systems: hardware organization and design (3rd ed.)
An axiomatic basis for computer programming
Communications of the ACM
Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
LOGE: a highly effective system for logic design automation
ACM SIGDA Newsletter
VLSI test expertise system using a control flow model
DAC '84 Proceedings of the 21st Design Automation Conference
Automatic generation of microprocessor test programs
DAC '82 Proceedings of the 19th Design Automation Conference
CADOC: a system for computed aided functional test
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
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A complex circuit can be described at the structural level (gate or register transfer description), at the functional level (state based description) or at a higher level (algorithmic or behavioral level). Test methods have been studied at each level but present severe constraints: complexity problems for the structural level, and error hypotheses for the other levels. After a presentation of the state of the art, we show that the practical solution is a multilevel approach using the techniques of each type of these methods.