Functional testing techniques for digital LSI/VLSI systems

Authors:
Stephen Y.H. Su;Tonysheng Lin
Affiliations:
Research Group on Design Automation and Fault-Tolerant Computing, Department of Computer Science, Thomas J. Watson School of Engineering, Applied Science and Technology, State University of New Yo ...;Research Group on Design Automation and Fault-Tolerant Computing, Department of Computer Science, Thomas J. Watson School of Engineering, Applied Science and Technology, State University of New Yo ...
Venue:
DAC '84 Proceedings of the 21st Design Automation Conference
Year:
1984

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Abstract

Functional testing is becomilng more important due to the increasing complexity in digital LSI/VLSI devices. Various functional testing approaches have been proposed to meet this urgent need in LSI/VLSI testing. This paper presents the basic ideas behind deterministic functional testing and concisely overviews eight major functional testing techniques. Comparisons among these techniques and suggestions for future development are made to meet the challenges in this fast growing testing field.