Automatic functional test program generation for microprocessors

Authors:
Chen-Shang Lin;Hong-Fa Ho
Affiliations:
Department of Electrical Engineering, National Taiwan University, Taipei 10764, Taiwan;Department of Electrical Engineering, National Taiwan University, Taipei 10764, Taiwan
Venue:
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
Year:
1988

Citing 2
Cited 2

Elements of the Theory of Computation

Elements of the Theory of Computation
Automatic generation of microprocessor test programs

DAC '82 Proceedings of the 19th Design Automation Conference

Native mode functional test generation for processors with applications to self test and design validation

ITC '98 Proceedings of the 1998 IEEE International Test Conference
A hybrid software-based self-testing methodology for embedded processor

Proceedings of the 2008 ACM symposium on Applied computing

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Abstract

A new algorithm, O-algorithm, for automatic test program generation of microprocessors in a user environment is presented. Specifically, to eliminate the redundant tests, a weighted-digraph model is used to model the signal flow of the general microprocessors. Improved functional fault models of microprocessors are derived from Turing machine model. The O-algorithm is then constructed based on the signal flow model and functional fault models. The complexity of our algorithm is better than [6]. Moreover, the simulation had shown that the fault coverage is better than 97%.