Microprocessing and Microprogramming
CRIS: a test cultivation program for sequential VLSI circuits
ICCAD '92 1992 IEEE/ACM international conference proceedings on Computer-aided design
Automatic functional test program generation for microprocessors
DAC '88 Proceedings of the 25th ACM/IEEE Design Automation Conference
A Unified Framework for Design Validation and Manufacturing Test
Proceedings of the IEEE International Test Conference on Test and Design Validity
The Effect of Different Test Sets on Quality Level Prediction: When is 80% better than 90%?
Proceedings of the IEEE International Test Conference on Test: Faster, Better, Sooner
Functional Testing of Current Microprocessors (applied to the Intel i860TM)
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
An Instruction Sequence Assembling Methodology for Testing Microprocessors
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Testing functional faults in VLSI
DAC '82 Proceedings of the 19th Design Automation Conference
Multiprocessor design verification for the PowerPC 620 microprocessor
ICCD '95 Proceedings of the 1995 International Conference on Computer Design: VLSI in Computers and Processors
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
IEEE Design & Test
Functional Testing of Microprocessors
IEEE Transactions on Computers
Test Generation for Microprocessors
IEEE Transactions on Computers
Analysis of experimental results on functional testing and diagnosis of complex circuits
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Microprocessor testing by instruction sequences derived from random patterns
ITC'88 Proceedings of the 1988 international conference on Test: new frontiers in testing
Synthesis of Native Mode Self-Test Programs
Journal of Electronic Testing: Theory and Applications - special issue on high-level test synthesis
Functional verification of the equator MAP1000 microprocessor
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Embedded hardware and software self-testing methodologies for processor cores
Proceedings of the 37th Annual Design Automation Conference
An RTL Abstraction Technique for Processor MicroarchitectureValidation and Test Generation
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Deterministic software-based self-testing of embedded processor cores
Proceedings of the conference on Design, automation and test in Europe
Instruction-level DFT for testing processor and IP cores in system-on-a-chip
Proceedings of the 38th annual Design Automation Conference
Testing for interconnect crosstalk defects using on-chip embedded processor cores
Proceedings of the 38th annual Design Automation Conference
Selective-run built-in self-test using an embedded processor
Proceedings of the 12th ACM Great Lakes symposium on VLSI
Embedded software-based self-testing for SoC design
Proceedings of the 39th annual Design Automation Conference
Test of future system-on-chips
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
On Design Validation Using Verification Technology
Journal of Electronic Testing: Theory and Applications
Testing for Interconnect Crosstalk Defects Using On-Chip Embedded Processor Cores
Journal of Electronic Testing: Theory and Applications
Postsilicon Validation Methodology for Microprocessors
IEEE Design & Test
Embedded Software-Based Self-Test for Programmable Core-Based Designs
IEEE Design & Test
Instruction-Based Self-Testing of Processor Cores
Journal of Electronic Testing: Theory and Applications
A scalable software-based self-test methodology for programmable processors
Proceedings of the 40th annual Design Automation Conference
Verification of Processor Microarchitectures
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Instruction Randomization Self Test For Processor Cores
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Test Program Synthesis for Path Delay Faults in Microprocessor Cores
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test
Effective Software-Based Self-Test Strategies for On-Line Periodic Testing of Embedded Processors
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Designing Self Test Programs for Embedded DSP Cores
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Automatic Test Program Generation: A Case Study
IEEE Design & Test
A Low-Cost At-Speed BIST Architecture for Embedded Processor and SRAM Cores
Journal of Electronic Testing: Theory and Applications
Re-configurable embedded core test protocol
Proceedings of the 2004 Asia and South Pacific Design Automation Conference
Low-Cost Software-Based Self-Testing of RISC Processor Cores
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Fully Automatic Test Program Generation for Microprocessor Cores
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Software-Based Self-Testing of Embedded Processors
IEEE Transactions on Computers
A constraint-based solution for on-line testing of processors embedded in real-time applications
SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
Automatic generation of test sets for SBST of microprocessor IP cores
SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
Instruction-level test methodology for CPU core self-testing
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Software-based self-test methodology for crosstalk faults in processors
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Optimal periodic testing of intermittent faults in embedded pipelined processor applications
Proceedings of the conference on Design, automation and test in Europe: Proceedings
A Self Test Program Design Technique for Embedded DSP Cores
Journal of Electronic Testing: Theory and Applications
Systematic software-based self-test for pipelined processors
Proceedings of the 43rd annual Design Automation Conference
Simulation-Based Functional Test Generation for Embedded Processors
IEEE Transactions on Computers
Efficient techniques for automatic verification-oriented test set optimization
International Journal of Parallel Programming
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A hybrid software-based self-testing methodology for embedded processor
Proceedings of the 2008 ACM symposium on Applied computing
On efficient generation of instruction sequences to test for delay defects in a processor
Proceedings of the 18th ACM Great Lakes symposium on VLSI
CASP: concurrent autonomous chip self-test using stored test patterns
Proceedings of the conference on Design, automation and test in Europe
Testing diagnostics of modern microprocessors with the use of functional models
Automation and Remote Control
Instruction-based self-testing of delay faults in pipelined processors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
Operating system scheduling for efficient online self-test in robust systems
Proceedings of the 2009 International Conference on Computer-Aided Design
Post-silicon validation opportunities, challenges and recent advances
Proceedings of the 47th Design Automation Conference
Systematic software-based self-test for pipelined processors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Evolution of test programs exploiting a FSM processor model
EvoApplications'11 Proceedings of the 2011 international conference on Applications of evolutionary computation - Volume Part II
Automatic completion and refinement of verification sets for microprocessor cores
EC'05 Proceedings of the 3rd European conference on Applications of Evolutionary Computing
Software-Based Testing for System Peripherals
Journal of Electronic Testing: Theory and Applications
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New methodologies based on functional testing andbuilt-in self-test can narrow the gap betw een necessarysolutions and existing techniques for processor validation and testing. We present a versatile automatic functional test generation methodology for microprocessors.The generated assembly instruction sequences can beapplied to both design validation and manufacturingtest, especially in high speed "native" mode. All thefunctional capabilities of complex processors can be exercised, leading to high quality validation sequences andmanufacturing tests with high fault coverage. The testscan also be applied in a built-in self-test fashion. Experimental results on two microprocessors show that thismethod is very effective in generating high quality manufacturing tests as well as in functional design validation.