Functional verification of the equator MAP1000 microprocessor

Authors:
Jian Shen;Jacob Abraham;Dave Baker;Tony Hurson;Martin Kinkade;Gregorio Gervasio;Chen-chau Chu;Guanghui Hu
Affiliations:
Computer Engineering Research Center, The University of Texas at Austin, Austin, Texas;Computer Engineering Research Center, The University of Texas at Austin, Austin, Texas;Equator Technologies Inc., Austin, Texas;Equator Technologies Inc., Austin, Texas;Equator Technologies Inc., Austin, Texas;Equator Technologies Inc., Austin, Texas;Equator Technologies Inc., Austin, Texas;Equator Technologies Inc., Austin, Texas
Venue:
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Year:
1999

On the test of microprocessor IP cores

Proceedings of the conference on Design, automation and test in Europe
Graph-Based Functional Test Program Generation for Pipelined Processors

Proceedings of the conference on Design, automation and test in Europe - Volume 1
Fully Automatic Test Program Generation for Microprocessor Cores

DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Functional Coverage Driven Test Generation for Validation of Pipelined Processors

Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Automatic generation of test sets for SBST of microprocessor IP cores

SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
Interactive presentation: Automatic generation of functional coverage models from behavioral verilog descriptions

Proceedings of the conference on Design, automation and test in Europe

Hi-index	0.00