Retargetable self-test program generation using constraint logic programming
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Computer architecture (2nd ed.): a quantitative approach
Computer architecture (2nd ed.): a quantitative approach
Functional verification of the equator MAP1000 microprocessor
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Microprocessor based testing for core-based system on chip
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
On the test of microprocessor IP cores
Proceedings of the conference on Design, automation and test in Europe
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Evolutionary Test Program Induction for Microprocessor Design Verification
ATS '02 Proceedings of the 11th Asian Test Symposium
Superscalar Processor Validation at the Microarchitecture Level
VLSID '99 Proceedings of the 12th International Conference on VLSI Design - 'VLSI for the Information Appliance'
Instruction Randomization Self Test For Processor Cores
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
DEFUSE: A Deterministic Functional Self-Test Methodology for Processors
VTS '00 Proceedings of the 18th IEEE VLSI Test Symposium
Effective Software Self-Test Methodology for Processor Cores
Proceedings of the conference on Design, automation and test in Europe
Efficient machine-code test-program induction
CEC '02 Proceedings of the Evolutionary Computation on 2002. CEC '02. Proceedings of the 2002 Congress - Volume 02
Automatic Generation of Validation Stimuli for Application-Specific Processors
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Designing Self Test Programs for Embedded DSP Cores
Proceedings of the conference on Design, automation and test in Europe - Volume 2
Automatic Test Program Generation: A Case Study
IEEE Design & Test
Code Generation for Functional Validation of Pipelined Microprocessors
Journal of Electronic Testing: Theory and Applications
Software-Based Self-Testing of Embedded Processors
IEEE Transactions on Computers
New evolutionary techniques for test-program generation for complex microprocessor cores
GECCO '05 Proceedings of the 7th annual conference on Genetic and evolutionary computation
Automatic generation of test sets for SBST of microprocessor IP cores
SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
MicroGP—An Evolutionary Assembly Program Generator
Genetic Programming and Evolvable Machines
Software-based self-test of processors under power constraints
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Software-based self-testing of microprocessors
Journal of Systems Architecture: the EUROMICRO Journal
Software-based self-testing with multiple-level abstractions for soft processor cores
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A hybrid software-based self-testing methodology for embedded processor
Proceedings of the 2008 ACM symposium on Applied computing
On efficient generation of instruction sequences to test for delay defects in a processor
Proceedings of the 18th ACM Great Lakes symposium on VLSI
Testing diagnostics of modern microprocessors with the use of functional models
Automation and Remote Control
An enhanced framework for microprocessor test-program generation
EuroGP'03 Proceedings of the 6th European conference on Genetic programming
An evolutionary methodology for test generation for peripheral cores via dynamic FSM extraction
Evo'08 Proceedings of the 2008 conference on Applications of evolutionary computing
Feedback-based coverage directed test generation: an industrial evaluation
HVC'10 Proceedings of the 6th international conference on Hardware and software: verification and testing
Markov modelling and parameterisation of genetic evolutionary test generations
Journal of Global Optimization
Coverage-Directed Test Generation Automated by Machine Learning -- A Review
ACM Transactions on Design Automation of Electronic Systems (TODAES)
GABES: A genetic algorithm based environment for SEU testing in SRAM-FPGAs
Journal of Systems Architecture: the EUROMICRO Journal
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Microprocessor cores are a major challenge in the test arena: not only is their complexity always increasing, but also their specific characteristics intensify all difficulties. A microprocessor embedded inside a SOC is even harder to test since its input might be harder to control and its behavior may be harder to observe. Functional testing is an effective solution which consists in forcing the microprocessor to execute a suitable test program. This paper presents a new approach to automatic test program generation exploiting an evolutionary paradigm. It overcomes the main limitations of previous methodologies and provides significantly better results. Human intervention is limited to the enumeration of all assembly instructions. Also internal parameters of the optimizer are auto-adapted. Experimental results show the effectiveness of the approach.