Adaptation in natural and artificial systems
Adaptation in natural and artificial systems
Inverting the resolution principle
Machine intelligence 12
Genetic programming: on the programming of computers by means of natural selection
Genetic programming: on the programming of computers by means of natural selection
Genetic programming: an introduction: on the automatic evolution of computer programs and its applications
Micro architecture coverage directed generation of test programs
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
ACM Computing Surveys (CSUR)
Coverage directed test generation for functional verification using bayesian networks
Proceedings of the 40th annual Design Automation Conference
A Genetic Testing Framework for Digital Integrated Circuits
ICTAI '02 Proceedings of the 14th IEEE International Conference on Tools with Artificial Intelligence
Code Generation for Functional Validation of Pipelined Microprocessors
ETW '03 Proceedings of the 8th IEEE European Test Workshop
HITEC: a test generation package for sequential circuits
EURO-DAC '91 Proceedings of the conference on European design automation
Automatic test program generation for pipelined processors
Proceedings of the 2003 ACM symposium on Applied computing
Writing Testbenches: Functional Verification of HDL Models, Second Edition
Writing Testbenches: Functional Verification of HDL Models, Second Edition
Automatic Test Program Generation: A Case Study
IEEE Design & Test
Fully Automatic Test Program Generation for Microprocessor Cores
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
StressTest: an automatic approach to test generation via activity monitors
Proceedings of the 42nd annual Design Automation Conference
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Enhancing the control and efficiency of the covering process [logic verification]
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Efficient assertion based verification using TLM
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Elements of Information Theory (Wiley Series in Telecommunications and Signal Processing)
Elements of Information Theory (Wiley Series in Telecommunications and Signal Processing)
Harnessing Machine Learning to Improve the Success Rate of Stimuli Generation
IEEE Transactions on Computers
Comprehensive Functional Verification: The Complete Industry Cycle (Systems on Silicon)
Comprehensive Functional Verification: The Complete Industry Cycle (Systems on Silicon)
Enhancing the efficiency of Bayesian network based coverage directed test generation
HLDVT '04 Proceedings of the High-Level Design Validation and Test Workshop, 2004. Ninth IEEE International
A Survey of Hybrid Techniques for Functional Verification
IEEE Design & Test
Functional test selection based on unsupervised support vector analysis
Proceedings of the 45th annual Design Automation Conference
Towards Automating Simulation-Based Design Verification Using ILP
Inductive Logic Programming
Coverage Directed Test Generation: Godson Experience
ATS '08 Proceedings of the 2008 17th Asian Test Symposium
Automatic Boosting of Cross-Product Coverage Using Bayesian Networks
HVC '08 Proceedings of the 4th International Haifa Verification Conference on Hardware and Software: Verification and Testing
Functional Verification Coverage Measurement and Analysis
Functional Verification Coverage Measurement and Analysis
Hierarchical genetic algorithms operating on populations of computer programs
IJCAI'89 Proceedings of the 11th international joint conference on Artificial intelligence - Volume 1
Exploiting auto-adaptive µGP for highly effective test programs generation
ICES'03 Proceedings of the 5th international conference on Evolvable systems: from biology to hardware
An evolutionary methodology for test generation for peripheral cores via dynamic FSM extraction
Evo'08 Proceedings of the 2008 conference on Applications of evolutionary computing
Exploiting MOEA to automatically geneate test programs for path-delay faults in microprocessors
Evo'08 Proceedings of the 2008 conference on Applications of evolutionary computing
Microprocessor Verification via Feedback-Adjusted Markov Models
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
GABES: A genetic algorithm based environment for SEU testing in SRAM-FPGAs
Journal of Systems Architecture: the EUROMICRO Journal
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The increasing complexity and size of digital designs, in conjunction with the lack of a potent verification methodology that can effectively cope with this trend, continue to inspire engineers and academics in seeking ways to further automate design verification. In an effort to increase performance and to decrease engineering effort, research has turned to artificial intelligence (AI) techniques for effective solutions. The generation of tests for simulation-based verification can be guided by machine-learning techniques. In fact, recent advances demonstrate that embedding machine-learning (ML) techniques into a coverage-directed test generation (CDG) framework can effectively automate the test generation process, making it more effective and less error-prone. This article reviews some of the most promising approaches in this field, aiming to evaluate the approaches and to further stimulate more directed research in this area.