Exploiting auto-adaptive µGP for highly effective test programs generation

Authors:
F. Corno;F. Cumani;G. Squillero
Affiliations:
Politecnico di Torino, Dipartimento di Automatica e Informatica, Torino, Italy;Politecnico di Torino, Dipartimento di Automatica e Informatica, Torino, Italy;Politecnico di Torino, Dipartimento di Automatica e Informatica, Torino, Italy
Venue:
ICES'03 Proceedings of the 5th international conference on Evolvable systems: from biology to hardware
Year:
2003

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Abstract

Integrated-circuit producers are shoved by competitive pressure; new devices require increasingly complex verifications to be performed at increasing pace. This paper presents a methodology to automatically induce a test program for a microprocessor that maximizes a given verification metric. The methodology is based on an auto-adaptive evolutionary algorithm and exploits a syntactical description of microprocessor assembly language and an RT-level functional model. Experimental results clearly show the effectiveness of the approach. Comparisons reveal how auto-adaptive mechanisms dramatically enhance both performances and quality of the results.