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Micro architecture coverage directed generation of test programs
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Code Generation for Functional Validation of Pipelined Microprocessors
ETW '03 Proceedings of the 8th IEEE European Test Workshop
Automatic test program generation for pipelined processors
Proceedings of the 2003 ACM symposium on Applied computing
Automatic Test Program Generation: A Case Study
IEEE Design & Test
Fully Automatic Test Program Generation for Microprocessor Cores
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
MicroGP—An Evolutionary Assembly Program Generator
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Aspect-Oriented Programming with the e Verification Language: A Pragmatic Guide for Testbench Developers
Functional Verification Coverage Measurement and Analysis
Functional Verification Coverage Measurement and Analysis
Exploiting auto-adaptive µGP for highly effective test programs generation
ICES'03 Proceedings of the 5th international conference on Evolvable systems: from biology to hardware
An evolutionary methodology for test generation for peripheral cores via dynamic FSM extraction
Evo'08 Proceedings of the 2008 conference on Applications of evolutionary computing
Exploiting MOEA to automatically geneate test programs for path-delay faults in microprocessors
Evo'08 Proceedings of the 2008 conference on Applications of evolutionary computing
Evolutionary Computation for Modeling and Optimization
Evolutionary Computation for Modeling and Optimization
Evolutionary Optimization: the GP toolkit
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Although there are quite a few approaches to Coverage Directed test Generation aided by Machine Learning which have been applied successfully to small and medium size digital designs, it is not clear how they would scale on more elaborate industrial-level designs. This paper evaluates one of these techniques, called MicroGP, on a fully fledged industrial design. The results indicate relative success evidenced by a good level of code coverage achieved with reasonably compact tests when compared to traditional test generation approaches. However, there is scope for improvement especially with respect to the diversity of the tests evolved.