Design and validation of computer protocols
Design and validation of computer protocols
IBM Power and PowerPC
Automatic test program generation for pipelined processors
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
AVPGEN—a test generator for architecture verification
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Architecture validation for processors
ISCA '95 Proceedings of the 22nd annual international symposium on Computer architecture
Code generation and analysis for the functional verification of micro processors
DAC '96 Proceedings of the 33rd annual Design Automation Conference
DAC '96 Proceedings of the 33rd annual Design Automation Conference
Symbolic Model Checking
Architectural Verification of Processors Using Symbolic Instruction Graphs
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
A Methodology for Processor Implementation Verification
FMCAD '96 Proceedings of the First International Conference on Formal Methods in Computer-Aided Design
Coverage-Directed Test Generation Using Symbolic Techniques
FMCAD '96 Proceedings of the First International Conference on Formal Methods in Computer-Aided Design
Methodology and System for Practical Formal Verification of Reactive Hardware
CAV '94 Proceedings of the 6th International Conference on Computer Aided Verification
Compacting regression-suites on-the-fly
APSEC '97 Proceedings of the Fourth Asia-Pacific Software Engineering and International Computer Science Conference
Systematic Validation of Pipeline Interlock for Superscalar Microarchitectures
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Postsilicon Validation Methodology for Microprocessors
IEEE Design & Test
Coverage Metrics for Functional Validation of Hardware Designs
IEEE Design & Test
Coverage-oriented verification of banias
Proceedings of the 40th annual Design Automation Conference
Coverage directed test generation for functional verification using bayesian networks
Proceedings of the 40th annual Design Automation Conference
Cost Evaluation of Coverage Directed Test Generation for the IBM Mainframe
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Graph-Based Functional Test Program Generation for Pipelined Processors
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Systematic functional coverage metric synthesis from hierarchical temporal event relation graph
Proceedings of the 41st annual Design Automation Conference
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
A generic micro-architectural test plan approach for microprocessor verification
Proceedings of the 42nd annual Design Automation Conference
Piparazzi: a test program generator for micro-architecture flow verification
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Test generation using SAT-based bounded model checking for validation of pipelined processors
GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
Functional test generation using property decompositions for validation of pipelined processors
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Design fault directed test generation for microprocessor validation
Proceedings of the conference on Design, automation and test in Europe
Interactive presentation: Functional and timing validation of partially bypassed processor pipelines
Proceedings of the conference on Design, automation and test in Europe
Active sampling for multiple output identification
Machine Learning
Specification-driven directed test generation for validation of pipelined processors
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Automatic Boosting of Cross-Product Coverage Using Bayesian Networks
HVC '08 Proceedings of the 4th International Haifa Verification Conference on Hardware and Software: Verification and Testing
Functional test generation using design and property decomposition techniques
ACM Transactions on Embedded Computing Systems (TECS)
Generating test programs to cover pipeline interactions
Proceedings of the 46th Annual Design Automation Conference
Using virtual coverage to hit hard-to-reach events
HVC'07 Proceedings of the 3rd international Haifa verification conference on Hardware and software: verification and testing
Feedback-based coverage directed test generation: an industrial evaluation
HVC'10 Proceedings of the 6th international conference on Hardware and software: verification and testing
A probabilistic analysis of coverage methods
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Coverage-Directed Test Generation Automated by Machine Learning -- A Review
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Active sampling for multiple output identification
COLT'06 Proceedings of the 19th annual conference on Learning Theory
ESL Design and Verification: A Prescription for Electronic System Level Methodology
ESL Design and Verification: A Prescription for Electronic System Level Methodology
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