Coverage-Directed Test Generation Using Symbolic Techniques

Toward formalizing a validation methodology using simulation coverage

DAC '97 Proceedings of the 34th annual Design Automation Conference

Abstraction Techniques for Validation Coverage Analysis and Test Generation

IEEE Transactions on Computers

OCCOM: efficient computation of observability-based code coverage metrics for functional verification

DAC '98 Proceedings of the 35th annual Design Automation Conference

Micro architecture coverage directed generation of test programs

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

Enhancing simulation with BDDs and ATPG

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

A study in coverage-driven test generation

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

Improving coverage analysis and test generation for large designs

ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design

A Buffer-Oriented Methodology for Microarchitecture Validation

Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification

An RTL Abstraction Technique for Processor MicroarchitectureValidation and Test Generation

Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification

Verification Simulation Acceleration UsingCode-Perturbation

Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification

Semi-formal test generation with genevieve

Proceedings of the 38th annual Design Automation Conference

SIVA: A System for Coverage-Directed State Space Search

Journal of Electronic Testing: Theory and Applications

Simulation coverage enhancement using test stimulus transformation

Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design

On Design Validation Using Verification Technology

Journal of Electronic Testing: Theory and Applications

Effectiveness of Microarchitecture Test Program Generation

IEEE Design & Test

A Temporal Logic Based Theory of Test Coverage and Generation

TACAS '02 Proceedings of the 8th International Conference on Tools and Algorithms for the Construction and Analysis of Systems

Coverability Analysis Using Symbolic Model Checking

CHARME '01 Proceedings of the 11th IFIP WG 10.5 Advanced Research Working Conference on Correct Hardware Design and Verification Methods

Improvements in Coverability Analysis

FME '02 Proceedings of the International Symposium of Formal Methods Europe on Formal Methods - Getting IT Right

Coverage-oriented verification of banias

Proceedings of the 40th annual Design Automation Conference

12.1 Using Verification Technology for Validation Coverage Analysis and Test Generation

VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium

Verification of Processor Microarchitectures

VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium

Cost Evaluation of Coverage Directed Test Generation for the IBM Mainframe

ITC '01 Proceedings of the 2001 IEEE International Test Conference

Fault Models and Test Generation for Hardware-Software Covalidation

IEEE Design & Test

Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

Algorithms for compacting error traces

ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference

Semi-formal test generation and resolving a temporal abstraction problem in practice: industrial application

ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference

Guiding simulation with increasingly refined abstract traces

Proceedings of the 43rd annual Design Automation Conference

Interactive presentation: Automatic generation of functional coverage models from behavioral verilog descriptions

Proceedings of the conference on Design, automation and test in Europe

A Survey of Hybrid Techniques for Functional Verification

IEEE Design & Test

Functional test selection based on unsupervised support vector analysis

Proceedings of the 45th annual Design Automation Conference

Generating test programs to cover pipeline interactions

Proceedings of the 46th Annual Design Automation Conference

Simulation vs. formal: absorb what is useful; reject what is useless

HVC'07 Proceedings of the 3rd international Haifa verification conference on Hardware and software: verification and testing

Increasing the efficiency of simulation-based functional verification through unsupervised support vector analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

An introduction to test specification in FQL

HVC'10 Proceedings of the 6th international conference on Hardware and software: verification and testing

Online selection of effective functional test programs based on novelty detection

Proceedings of the International Conference on Computer-Aided Design