Cost Evaluation of Coverage Directed Test Generation for the IBM Mainframe

  • Authors:
  • Gilly Nativ;Steven Mittermaier;Shmuel Ur;Avi Ziv

  • Affiliations:
  • -;-;-;-

  • Venue:
  • ITC '01 Proceedings of the 2001 IEEE International Test Conference
  • Year:
  • 2001

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Abstract

Test generation and simulation tools have input stimuli thatcan direct them to cover specific events. However, the costof completely covering a verification plan is still very high.While coverage analysis tools can find events that have notbeen covered, they do not provide an automated coveringmethod. This paper presents the first implementation of ageneration framework that uses feedback from coverageanalysis to direct microarchitecture simulation. Thisframework uses a coverage analysis tool to find events thathave not been simulated and then utilizes information aboutthe design to determine which directives should be given tothe simulation environment. This paper describes, in detail,the system and its operation process, an experiment thatuses the system, and the results of the experiment. Thissystem was shown to reduce the machine time and persontime required to cover the test plan. Implications of thiswork suggest the types of verification plans appropriate forthe utilization of this system and the further experiments anddevelopments required.