The craft of software testing: subsystem testing including object-based and object-oriented testing
The craft of software testing: subsystem testing including object-based and object-oriented testing
Verification of electronic systems
DAC '96 Proceedings of the 33rd annual Design Automation Conference
User defined coverage—a tool supported methodology for design verification
DAC '98 Proceedings of the 35th annual Design Automation Conference
DAC '98 Proceedings of the 35th annual Design Automation Conference
Micro architecture coverage directed generation of test programs
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Developing an architecture validation suite: application to the PowerPC architecture
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Functional verification—real users, real problems, real opportunities (panel)
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Validating the intel pentium 4 microprocessor
Proceedings of the 38th annual Design Automation Conference
Coverage-Directed Test Generation Using Symbolic Techniques
FMCAD '96 Proceedings of the First International Conference on Formal Methods in Computer-Aided Design
Smart diagnostics for configurable processor verification
Proceedings of the 42nd annual Design Automation Conference
Practical methods in coverage-oriented verification of the merom microprocessor
Proceedings of the 43rd annual Design Automation Conference
Phoenix: Detecting and Recovering from Permanent Processor Design Bugs with Programmable Hardware
Proceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture
Proceedings of the conference on Design, automation and test in Europe
Online design bug detection: RTL analysis, flexible mechanisms, and evaluation
Proceedings of the 41st annual IEEE/ACM International Symposium on Microarchitecture
Evaluating Workloads Using Comparative Functional Coverage
HVC '08 Proceedings of the 4th International Haifa Verification Conference on Hardware and Software: Verification and Testing
A probabilistic analysis method for functional qualification under mutation analysis
DATE '12 Proceedings of the Conference on Design, Automation and Test in Europe
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The growing complexity of state-of-art microprocessors dictates the use of cost-effective verification methods. Functional coverage was widely applied in the verification of Banias, Intel's new IA-32 microprocessor designed solely for the mobile computing market. In this paper, we describe the practical coverage approach as was carried out in the verification of Banias. According to this Coverage-Oriented verification approach, focus shifts gradually from basic logic cleanup using random testing, where verification follows a predefined test plan, to coverage-driven verification, where verification resources are steered to hit coverage holes. This practical approach enables reaching higher quality for lower effort under a tightened schedule, and provides a clear metric to measure the progress of verification and the quality of the design under test. As the conclusions will show, the retrospective evaluation of this approach shed light on its significant impact beyond original intentions, as well as uncovering several potential areas for refinement that will make this approach even more effective on future projects.