A study in coverage-driven test generation

Fast prototyping: a system design flow for fast design, prototyping and efficient IP reuse

CODES '99 Proceedings of the seventh international workshop on Hardware/software codesign

Fast prototyping: a system design flow applied to a complex system-on-chip multiprocessor design

Proceedings of the 36th annual ACM/IEEE Design Automation Conference

An efficient design-for-verification technique for HDLs

Proceedings of the 2001 Asia and South Pacific Design Automation Conference

Semi-formal test generation with genevieve

Proceedings of the 38th annual Design Automation Conference

Simulation coverage enhancement using test stimulus transformation

Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design

Coverage Metrics for Functional Validation of Hardware Designs

IEEE Design & Test

Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System

FME '01 Proceedings of the International Symposium of Formal Methods Europe on Formal Methods for Increasing Software Productivity

Automatic Functional Vector Generation Using the Interacting FSM Model

ISQED '01 Proceedings of the 2nd International Symposium on Quality Electronic Design

Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories

VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium

Assertion-based automated functional vectors generation using constraint logic programming

Proceedings of the 14th ACM Great Lakes symposium on VLSI

Algorithms for compacting error traces

ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference

Semi-formal test generation and resolving a temporal abstraction problem in practice: industrial application

ASP-DAC '03 Proceedings of the 2003 Asia and South Pacific Design Automation Conference

Design fault directed test generation for microprocessor validation

Proceedings of the conference on Design, automation and test in Europe

Interactive presentation: Automatic generation of functional coverage models from behavioral verilog descriptions

Proceedings of the conference on Design, automation and test in Europe

Functional test selection based on unsupervised support vector analysis

Proceedings of the 45th annual Design Automation Conference

Using formal specifications to support testing

ACM Computing Surveys (CSUR)

Symbolic Model-based Test Selection

Electronic Notes in Theoretical Computer Science (ENTCS)

Design validation of multithreaded architectures using concurrent threads evolution

Proceedings of the 22nd Annual Symposium on Integrated Circuits and System Design: Chip on the Dunes

Software debugging, testing, and verification

IBM Systems Journal

Model-based test selection for infinite-state reactive systems

FMCO'06 Proceedings of the 5th international conference on Formal methods for components and objects

Increasing the efficiency of simulation-based functional verification through unsupervised support vector analysis

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

Fast enhancement of validation test sets for improving the stuck-at fault coverage of RTL circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems

An automatic coverage analysis for systemc using UML and aspect-oriented technology

CSCWD'04 Proceedings of the 8th international conference on Computer Supported Cooperative Work in Design I

Online selection of effective functional test programs based on novelty detection

Proceedings of the International Conference on Computer-Aided Design

Symbolic test selection based on approximate analysis

TACAS'05 Proceedings of the 11th international conference on Tools and Algorithms for the Construction and Analysis of Systems

Targeted random test generation for power-aware multicore designs

ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on verification challenges in the concurrent world