Design and validation of computer protocols
Design and validation of computer protocols
Automatic test program generation for pipelined processors
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
The Stanford FLASH multiprocessor
ISCA '94 Proceedings of the 21st annual international symposium on Computer architecture
Formally verifying a microprocessor using a simulation methodology
DAC '94 Proceedings of the 31st annual Design Automation Conference
Automatic verification of pipelined microprocessors
DAC '94 Proceedings of the 31st annual Design Automation Conference
Protocol Verification as a Hardware Design Aid
ICCD '92 Proceedings of the 1991 IEEE International Conference on Computer Design on VLSI in Computer & Processors
Architectural Verification of Processors Using Symbolic Instruction Graphs
ICCS '94 Proceedings of the1994 IEEE International Conference on Computer Design: VLSI in Computer & Processors
Automatic verification of Pipelined Microprocessor Control
CAV '94 Proceedings of the 6th International Conference on Computer Aided Verification
Target-sensitive construction of diagnostic programs for procedure calling sequence generators
PLDI '96 Proceedings of the ACM SIGPLAN 1996 conference on Programming language design and implementation
Validation coverage analysis for complex digital designs
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Toward formalizing a validation methodology using simulation coverage
DAC '97 Proceedings of the 34th annual Design Automation Conference
Abstraction Techniques for Validation Coverage Analysis and Test Generation
IEEE Transactions on Computers
DAC '98 Proceedings of the 35th annual Design Automation Conference
Validation with guided search of the state space
DAC '98 Proceedings of the 35th annual Design Automation Conference
Hybrid verification using saturated simulation
DAC '98 Proceedings of the 35th annual Design Automation Conference
Micro architecture coverage directed generation of test programs
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Coverage estimation for symbolic model checking
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Enhancing simulation with BDDs and ATPG
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Simulation vector generation from HDL descriptions for observability-enhanced statement coverage
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
A study in coverage-driven test generation
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Verification of a microprocessor using real world applications
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Probabilistic state space search
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Improving coverage analysis and test generation for large designs
ICCAD '99 Proceedings of the 1999 IEEE/ACM international conference on Computer-aided design
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
A Buffer-Oriented Methodology for Microarchitecture Validation
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
An RTL Abstraction Technique for Processor MicroarchitectureValidation and Test Generation
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Verification Simulation Acceleration UsingCode-Perturbation
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Validating the intel pentium 4 microprocessor
Proceedings of the 38th annual Design Automation Conference
A new verification methodology for complex pipeline behavior
Proceedings of the 38th annual Design Automation Conference
SIVA: A System for Coverage-Directed State Space Search
Journal of Electronic Testing: Theory and Applications
Simulation coverage enhancement using test stimulus transformation
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
On Design Validation Using Verification Technology
Journal of Electronic Testing: Theory and Applications
Effectiveness of Microarchitecture Test Program Generation
IEEE Design & Test
Postsilicon Validation Methodology for Microprocessors
IEEE Design & Test
Protocol Techniques for Testing Radiotherapy Accelerators
FORTE '02 Proceedings of the 22nd IFIP WG 6.1 International Conference Houston on Formal Techniques for Networked and Distributed Systems
Coverage Metrics for Temporal Logic Model Checking
TACAS 2001 Proceedings of the 7th International Conference on Tools and Algorithms for the Construction and Analysis of Systems
Formal Verification of Explicitly Parallel Microprocessors
CHARME '99 Proceedings of the 10th IFIP WG 10.5 Advanced Research Working Conference on Correct Hardware Design and Verification Methods
Exploiting Retiming in a Guided Simulation Based Validation Methodology
CHARME '99 Proceedings of the 10th IFIP WG 10.5 Advanced Research Working Conference on Correct Hardware Design and Verification Methods
Coverage Directed Generation of System-Level Test Cases for the Validation of a DSP System
FME '01 Proceedings of the International Symposium of Formal Methods Europe on Formal Methods for Increasing Software Productivity
A Practical Approach to Coverage in Model Checking
CAV '01 Proceedings of the 13th International Conference on Computer Aided Verification
Validating the Intel® Pentium® 4 Microprocessor
DSN '01 Proceedings of the 2001 International Conference on Dependable Systems and Networks (formerly: FTCS)
Verification of an Industrial CC-NUMA Server
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
ASP-DAC '02 Proceedings of the 2002 Asia and South Pacific Design Automation Conference
12.1 Using Verification Technology for Validation Coverage Analysis and Test Generation
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
Verification of Processor Microarchitectures
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Si-Emulation: System Verification Using Simulation and Emulation
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Systematic Validation of Pipeline Interlock for Superscalar Microarchitectures
FTCS '95 Proceedings of the Twenty-Fifth International Symposium on Fault-Tolerant Computing
Software for multiprocessor networks on chip
Networks on chip
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test
Automatic Detection and Diagnosis of Faults in Generated Code for Procedure Calls
IEEE Transactions on Software Engineering
Efficient ATPG for Design Validation Based On Partitioned State Exploration Histories
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Automatic circuit extractor for HDL description using program slicing
Journal of Computer Science and Technology - Special issue on computer graphics and computer-aided design
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
Transition-based coverage estimation for symbolic model checking
ASP-DAC '06 Proceedings of the 2006 Asia and South Pacific Design Automation Conference
Functional test generation using property decompositions for validation of pipelined processors
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Coverage metrics for temporal logic model checking
Formal Methods in System Design
Engineering trust with semantic guardians
Proceedings of the conference on Design, automation and test in Europe
A Survey of Hybrid Techniques for Functional Verification
IEEE Design & Test
An effective guidance strategy for abstraction-guided simulation
Proceedings of the 44th annual Design Automation Conference
Specification-driven directed test generation for validation of pipelined processors
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Proceedings of the 45th annual Design Automation Conference
Specification-based compaction of directed tests for functional validation of pipelined processors
CODES+ISSS '08 Proceedings of the 6th IEEE/ACM/IFIP international conference on Hardware/Software codesign and system synthesis
Functional test generation using design and property decomposition techniques
ACM Transactions on Embedded Computing Systems (TECS)
Code-based test generation for validation of functional processor descriptions
TACAS'03 Proceedings of the 9th international conference on Tools and algorithms for the construction and analysis of systems
Simulation vs. formal: absorb what is useful; reject what is useless
HVC'07 Proceedings of the 3rd international Haifa verification conference on Hardware and software: verification and testing
A framework for testing hardware-software security architectures
Proceedings of the 26th Annual Computer Security Applications Conference
An efficient verification method for microprocessors based on the virtual machine
ICESS'04 Proceedings of the First international conference on Embedded Software and Systems
Improving testbench evaluation using normalized formal properties
VECoS'09 Proceedings of the Third international conference on Verification and Evaluation of Computer and Communication Systems
Quick detection of difficult bugs for effective post-silicon validation
Proceedings of the 49th Annual Design Automation Conference
Overcoming post-silicon validation challenges through quick error detection (QED)
Proceedings of the Conference on Design, Automation and Test in Europe
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Modem, high performance microprocessors are extremely complex machines which require substantial validation effort to ensure functional correctness prior to tapeout. Generating the corner cases to test these designs is a mostly manual process, where completion is hard to judge. Experience shows that the errors that are caught late in the design, many post-silicon, are interactions between different components in very improbable corner case situations. In this paper we present a technique that targets such error-causing interactions by automatically generat- ing test vectors that will cause the processor to exercise all transitions of the control logic in simulation. We use techniques from formal verification to derive transition tours of a fully enumerated state graph of the control logic of the processor. Our system works from a Verilog description of the original machine and is currently being used to validate an embedded dual-issue processor in the node controller of the Stanford FLASH Multiprocessor. Modeling the processor control results in 200K states and an 8M instruction trace to check all transitions of control arcs.