Automatic functional test generation using the extended finite state machine model
DAC '93 Proceedings of the 30th international Design Automation Conference
AVPGEN—a test generator for architecture verification
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Architecture validation for processors
ISCA '95 Proceedings of the 22nd annual international symposium on Computer architecture
DAC '96 Proceedings of the 33rd annual Design Automation Conference
An observability-based code coverage metric for functional simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Toward formalizing a validation methodology using simulation coverage
DAC '97 Proceedings of the 34th annual Design Automation Conference
Abstraction Techniques for Validation Coverage Analysis and Test Generation
IEEE Transactions on Computers
DAC '98 Proceedings of the 35th annual Design Automation Conference
Computer architecture (2nd ed.): a quantitative approach
Computer architecture (2nd ed.): a quantitative approach
Proceedings of the conference on Design, automation and test in Europe
Commercial Design Verification: Methodology and Tools
Proceedings of the IEEE International Test Conference on Test and Design Validity
The Journal of Supercomputing
CIS'04 Proceedings of the First international conference on Computational and Information Science
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Architectural verification is a critical aspect of themicroprocessor design cycle. In this paper, we presenta design verification environment centered around abiased random instruction generator for simulation-basedarchitectural verification of pipelined microprocessors.The instruction generator uses biases specified by theuser to generate instruction sequences for simulation.These biases are not hard-coded and can thus be changeddepending on the specific areas in the design and typeof design errors being targeted. Correctness checking isachieved using assertion checking and end-of-statecomparison with a high-level architectural model. Severalarchitectural-level errors are introduced into abehavioral model of the DLX processor to investigate theprocessor's response in the presence of design errors.Simulation experiments conducted using the behavioralmodel show that biased random instruction sequencesprovide higher coverage of RTL conditional branches anddesign errors than random instruction sequences ormanually-generated test programs. Furthermore,instruction sequences containing a high percentage ofread-after-write (RAW) and control dependencies are themost useful.