Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
An Efficient Logic Equivalence Checker for Industrial Circuits
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Automatic Vector Generation Using Constraints and Biasing
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Logic Design Validation via Simulation and Automatic Test Pattern Generation
Journal of Electronic Testing: Theory and Applications
Prototyping the M68060 for Concurrent Verification
IEEE Design & Test
ITC '99 Proceedings of the 1999 IEEE International Test Conference
The Journal of Supercomputing
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