Graph-Based Algorithms for Boolean Function Manipulation
IEEE Transactions on Computers
Automatic test program generation for pipelined processors
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Efficient generation of counterexamples and witnesses in symbolic model checking
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Architecture validation for processors
ISCA '95 Proceedings of the 22nd annual international symposium on Computer architecture
Formal verification of pipeline control using controlled token nets and abstract interpretation
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
GRASP: A Search Algorithm for Propositional Satisfiability
IEEE Transactions on Computers
EXPRESSION: a language for architecture exploration through compiler/simulator retargetability
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Micro architecture coverage directed generation of test programs
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
High-level test generation for design verification of pipelined microprocessors
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Using model checking to generate tests from requirements specifications
ESEC/FSE-7 Proceedings of the 7th European software engineering conference held jointly with the 7th ACM SIGSOFT international symposium on Foundations of software engineering
Model checking
An RTL Abstraction Technique for Processor MicroarchitectureValidation and Test Generation
Journal of Electronic Testing: Theory and Applications - Special issue on microprocessor test and verification
Chaff: engineering an efficient SAT solver
Proceedings of the 38th annual Design Automation Conference
SATIRE: a new incremental satisfiability engine
Proceedings of the 38th annual Design Automation Conference
A new verification methodology for complex pipeline behavior
Proceedings of the 38th annual Design Automation Conference
Effectiveness of Microarchitecture Test Program Generation
IEEE Design & Test
CAV '02 Proceedings of the 14th International Conference on Computer Aided Verification
Coverage directed test generation for functional verification using bayesian networks
Proceedings of the 40th annual Design Automation Conference
Computer Architecture: A Quantitative Approach
Computer Architecture: A Quantitative Approach
BerkMin: A Fast and Robust Sat-Solver
Proceedings of the conference on Design, automation and test in Europe
Using Counter Example Guided Abstraction Refinement to Find Complex Bugs
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Graph-Based Functional Test Program Generation for Pipelined Processors
Proceedings of the conference on Design, automation and test in Europe - Volume 1
Safety Property Verification Using Sequential SAT and Bounded Model Checking
IEEE Design & Test
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Proceedings of the conference on Design, Automation and Test in Europe - Volume 2
StressTest: an automatic approach to test generation via activity monitors
Proceedings of the 42nd annual Design Automation Conference
Automatic functional test program generation for pipelined processors using model checking
HLDVT '02 Proceedings of the Seventh IEEE International High-Level Design Validation and Test Workshop
Piparazzi: a test program generator for micro-architecture flow verification
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
Test generation using SAT-based bounded model checking for validation of pipelined processors
GLSVLSI '06 Proceedings of the 16th ACM Great Lakes symposium on VLSI
Functional test generation using property decompositions for validation of pipelined processors
Proceedings of the conference on Design, automation and test in Europe: Proceedings
Practical methods in coverage-oriented verification of the merom microprocessor
Proceedings of the 43rd annual Design Automation Conference
Directed Micro-architectural Test Generation for an Industrial Processor: A Case Study
MTV '06 Proceedings of the Seventh International Workshop on Microprocessor Test and Verification
Design fault directed test generation for microprocessor validation
Proceedings of the conference on Design, automation and test in Europe
Model-driven validation of SystemC designs
Proceedings of the 44th annual Design Automation Conference
Processor Description Languages
Processor Description Languages
Model-driven test generation for system level validation
HLDVT '07 Proceedings of the 2007 IEEE International High Level Design Validation and Test Workshop
Model checking PSL using HOL and SMV
HVC'06 Proceedings of the 2nd international Haifa verification conference on Hardware and software, verification and testing
Experimental analysis of different techniques for bounded model checking
TACAS'03 Proceedings of the 9th international conference on Tools and algorithms for the construction and analysis of systems
An analysis of SAT-based model checking techniques in an industrial environment
CHARME'05 Proceedings of the 13 IFIP WG 10.5 international conference on Correct Hardware Design and Verification Methods
Generating test programs to cover pipeline interactions
Proceedings of the 46th Annual Design Automation Conference
Automatic RTL Test Generation from SystemC TLM Specifications
ACM Transactions on Embedded Computing Systems (TECS)
SETER: Towards Architecture-Model Based Security Engineering
International Journal of Secure Software Engineering
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Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design methodology. Simulation using functional test vectors is the most widely used form of processor validation. A significant bottleneck in the validation of such systems is the lack of automated techniques for directed test generation. While existing model checking--based approaches have proposed several promising ideas for automated test generation, many challenges remain in applying them to industrial microprocessors. The time and resources required for test generation using existing model checking--based techniques can be prohibitively large. This article presents an efficient test generation technique using decompositional model checking. The contribution of the article is the development of both property and design decomposition procedures for efficient test generation of pipelined processors. Our experimental results using a multi-issue MIPS processor and an industrial processor based on Power Architecture™ Technology demonstrate several orders-of-magnitude reduction in validation effort by drastically reducing both test generation time and test program length.