Specification-driven directed test generation for validation of pipelined processors
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Processor Description Languages
Processor Description Languages
Functional test generation using design and property decomposition techniques
ACM Transactions on Embedded Computing Systems (TECS)
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Simulation-based validation of the current industrial processors typically use huge number of test programs generated at instruction set architecture (ISA) level. However, architectural test generation techniques have limitations in terms of exercising intricate micro-architectural artifacts. Therefore, it is necessary to use micro-architectural details during test generation. Furthermore, there is a lack of automated techniques for directed test generation targeting micro-architectural faults. To address these challenges, we present a directed test generation technique at micro-architectural level for functional validation of microprocessors. A processor model is described in a temporal specification language at micro-architecture level. The desired behaviors of micro-architecture mechanisms are expressed as temporal logic properties. We use decompositional model checking for systematic test generation. Our experiments using a processor based on the Power Architecture^TM Technology^1 shows very promising results in terms of test generation time as well as test program length.