Computer architecture: a quantitative approach
Computer architecture: a quantitative approach
Automatic test program generation for pipelined processors
ICCAD '94 Proceedings of the 1994 IEEE/ACM international conference on Computer-aided design
Test program generation for functional verification of PowerPC processors in IBM
DAC '95 Proceedings of the 32nd annual ACM/IEEE Design Automation Conference
Formal verification of pipeline control using controlled token nets and abstract interpretation
Proceedings of the 1998 IEEE/ACM international conference on Computer-aided design
EXPRESSION: a language for architecture exploration through compiler/simulator retargetability
DATE '99 Proceedings of the conference on Design, automation and test in Europe
Functional verification of the equator MAP1000 microprocessor
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Micro architecture coverage directed generation of test programs
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
High-level test generation for design verification of pipelined microprocessors
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
Instruction-level DFT for testing processor and IP cores in system-on-a-chip
Proceedings of the 38th annual Design Automation Conference
Functional abstraction driven design space exploration of heterogeneous programmable architectures
Proceedings of the 14th international symposium on Systems synthesis
Trace Table Based Approach for Pipeline Microprocessor Verification
CAV '97 Proceedings of the 9th International Conference on Computer Aided Verification
Formal Verification of Out-of-Order Execution Using Incremental Flushing
CAV '98 Proceedings of the 10th International Conference on Computer Aided Verification
Automatic verification of Pipelined Microprocessor Control
CAV '94 Proceedings of the 6th International Conference on Computer Aided Verification
A scalable software-based self-test methodology for programmable processors
Proceedings of the 40th annual Design Automation Conference
Automatic functional test program generation for pipelined processors using model checking
HLDVT '02 Proceedings of the Seventh IEEE International High-Level Design Validation and Test Workshop
Automatic functional test program generation for microprocessor verification
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Proceedings of the 41st annual Design Automation Conference
Specification-driven directed test generation for validation of pipelined processors
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Testing diagnostics of modern microprocessors with the use of functional models
Automation and Remote Control
Processor Description Languages
Processor Description Languages
Functional test generation using design and property decomposition techniques
ACM Transactions on Embedded Computing Systems (TECS)
Integrated verification approach during ADL-driven processor design
Microelectronics Journal
Systematic software-based self-test for pipelined processors
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Directed test generation for validation of multicore architectures
ACM Transactions on Design Automation of Electronic Systems (TODAES) - Special section on verification challenges in the concurrent world
Hi-index | 0.00 |
Functional verification is widely acknowledged as a major bottleneck in microprocessor design. While early work on specification driven functional test program generation has proposed several promising ideas, many challenges remain in applying them to realistic embedded processors. We present a graph coverage based functional test program generation approach for pipelined processors. The proposed methodology makes three important contributions. First, it automatically generates the graph model of the pipelinedprocessor from the speci.cation using functional abstraction. Second, it generates functional test programs based on the coverage of the pipeline behavior. Finally, the test generation time is drastically reduced due to the use of module level property checking. We applied this methodology on the DLX processor to demonstrate the usefulness of our approach.