High-level test generation for design verification of pipelined microprocessors

  • Authors:
  • David Van Campenhout;Trevor Mudge;John P. Hayes

  • Affiliations:
  • Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI;Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI;Department of Electrical Engineering and Computer Science, The University of Michigan, Ann Arbor, MI

  • Venue:
  • Proceedings of the 36th annual ACM/IEEE Design Automation Conference
  • Year:
  • 1999

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Abstract