Automatic Test Program Generation: A Case Study
IEEE Design & Test
Code Generation for Functional Validation of Pipelined Microprocessors
Journal of Electronic Testing: Theory and Applications
Feedback-based coverage directed test generation: an industrial evaluation
HVC'10 Proceedings of the 6th international conference on Hardware and software: verification and testing
Coverage-Directed Test Generation Automated by Machine Learning -- A Review
ACM Transactions on Design Automation of Electronic Systems (TODAES)
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Functional verification of pipelined microprocessors is a challenging task, as the behavior of a pipeline is determined by a sequence of instructions and by the interaction between their operands. This paper describes an approach to test-program generation based on an evolutionary algorithm. The proposed methodology is able to tackle complex pipelined designs. Human intervention is limited to the enumeration of all assembly instructions, and also internal parameters of the optimizer are auto-adapted. A prototype was built and exploited to generate test programs for the DLX/pII, a simple pipelined microprocessor. Test programs were devised trying to maximize the RT-level statement coverage. Results show the feasibility and effectiveness of the method.