Low-Cost Software-Based Self-Testing of RISC Processor Cores
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Fully Automatic Test Program Generation for Microprocessor Cores
DATE '03 Proceedings of the conference on Design, Automation and Test in Europe - Volume 1
Automatic generation of test sets for SBST of microprocessor IP cores
SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
Software-based self-testing with multiple-level abstractions for soft processor cores
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
A hybrid software-based self-testing methodology for embedded processor
Proceedings of the 2008 ACM symposium on Applied computing
On efficient generation of instruction sequences to test for delay defects in a processor
Proceedings of the 18th ACM Great Lakes symposium on VLSI
CASP: concurrent autonomous chip self-test using stored test patterns
Proceedings of the conference on Design, automation and test in Europe
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
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Software self-testing for embedded processor coresbased on their instruction set, is a topic of increasinginterest since it provides an excellent test resourcepartitioning technique for sharing the testing task ofcomplex Systems-on-Chip (SoC) between slow,inexpensive testers and embedded code stored in memorycores of the SoC. We introduce an efficient methodologyfor processor cores self-testing which requires knowledgeof their instruction set and Register Transfer (RT) leveldescription. Compared with functional testingmethodologies proposed in the past, our methodology ismore efficient in terms of fault coverage, test code sizeand test application time. Compared with recent softwarebased structural testing methodologies for processorcores, our methodology is superior in terms of testdevelopment effort and has significantly smaller code sizeand memory requirements, while virtually the same faultcoverage is achieved with an order of magnitude smallertest application time.