Automatic generation of test sets for SBST of microprocessor IP cores

  • Authors:
  • E. Sanchez;M. Reorda Reorda;G. Squillero;M. Violante

  • Affiliations:
  • Politecnico di Torino, Torino, Italy;Politecnico di Torino, Torino, Italy;Politecnico di Torino, Torino, Italy;Politecnico di Torino, Torino, Italy

  • Venue:
  • SBCCI '05 Proceedings of the 18th annual symposium on Integrated circuits and system design
  • Year:
  • 2005

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Abstract

Higher integration densities, smaller feature lengths, and other technology advances, as well as architectural evolution, have made microprocessor cores exceptionally complex. Currently, Software-Based Self-Test (SBST) is becoming an attractive test solution since it guarantees high fault coverage figures, runs at-speed, and matches core test requirements while exploiting low-cost ATEs. However, automatically generating test programs is still an open problem. This paper presents a novel approach for test program generation, that couples evolutionary techniques with hardware acceleration. The methodology was evaluated targeting a 5-stage pipelined processor implementing a SPARCv8 microprocessor core.