A methodology for the verification of a “system on chip”

  • Authors:
  • Daniel Geist;Giora Biran;Tamara Arons;Michael Slavkin;Yvgeny Nustov;Monica Farkas;Karen Holtz;Andy Long;Dave King;Steve Barret

  • Affiliations:
  • IBM Haifa Research Lab, MATAM Advanced Technology Center, Haifa, Israel;IBM Haifa Research Lab, MATAM Advanced Technology Center, Haifa, Israel;IBM Haifa Research Lab, MATAM Advanced Technology Center, Haifa, Israel;IBM Haifa Research Lab, MATAM Advanced Technology Center, Haifa, Israel;IBM Haifa Research Lab, MATAM Advanced Technology Center, Haifa, Israel;IBM Haifa Research Lab, MATAM Advanced Technology Center, Haifa, Israel;IBM Haifa Research Lab, MATAM Advanced Technology Center, Haifa, Israel;IBM Field Design Center, Essex Junction, VT;IBM Field Design Center, Essex Junction, VT;IBM Field Design Center, Essex Junction, VT

  • Venue:
  • Proceedings of the 36th annual ACM/IEEE Design Automation Conference
  • Year:
  • 1999

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Abstract