Software testing techniques (2nd ed.)
Software testing techniques (2nd ed.)
A Fortran language system for mutation-based software testing
Software—Practice & Experience
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
An experimental determination of sufficient mutant operators
ACM Transactions on Software Engineering and Methodology (TOSEM)
An observability-based code coverage metric for functional simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Toward formalizing a validation methodology using simulation coverage
DAC '97 Proceedings of the 34th annual Design Automation Conference
User defined coverage—a tool supported methodology for design verification
DAC '98 Proceedings of the 35th annual Design Automation Conference
Functional vector generation for HDL models using linear programming and 3-satisfiability
DAC '98 Proceedings of the 35th annual Design Automation Conference
Fault-simulation based design error diagnosis for sequential circuits
DAC '98 Proceedings of the 35th annual Design Automation Conference
Simulation vector generation from HDL descriptions for observability-enhanced statement coverage
Proceedings of the 36th annual ACM/IEEE Design Automation Conference
From Specification Validation to Hardware Testing: A Unified Method
Proceedings of the IEEE International Test Conference on Test and Design Validity
Reliability of the Path Analysis Testing Strategy
IEEE Transactions on Software Engineering
Weak Mutation Testing and Completeness of Test Sets
IEEE Transactions on Software Engineering
Theories of Program Testing and the Application of Revealing Subdomains
IEEE Transactions on Software Engineering
A Domain Strategy for Computer Program Testing
IEEE Transactions on Software Engineering
Partition Analysis: A Method Combining Testing and Verification
IEEE Transactions on Software Engineering
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage
Journal of Electronic Testing: Theory and Applications
A Validation Fault Model for Timing-Induced Functional Errors
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test
Domain Strategy and Coverage Metric for Validation
ISQED '05 Proceedings of the 6th International Symposium on Quality of Electronic Design
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During functional validation, corner cases and boundaryconditions are known to be difficult to verify. Wepropose a functional fault coverage metric for behavioralVHDL descriptions which evaluates the coverageof faults which cause the behavior to execute an incorrectfunctional domain. Although domain faults areknown to be a source of design errors, they are not targetedexplicitly by previous work in functional validation.We propose an efficient method to compute domaincoverage in VHDL descriptions and we generatedomain coverage results for several benchmark VHDLcircuits for comparison to other approaches.