High-level design verification of microprocessors via error modeling
ACM Transactions on Design Automation of Electronic Systems (TODAES)
From Design Validation to Hardware Testing: A Unified Approach
Journal of Electronic Testing: Theory and Applications - Special issue on the IEEE European Test Workshop
A data flow fault coverage metric for validation of behavioral HDL descriptions
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
RTL-Based Functional Test Generation for High Defects Coverage in Digital Systems
Journal of Electronic Testing: Theory and Applications
RTL Design Validation, DFT and Test Pattern Generation for High Defects Coverage
Journal of Electronic Testing: Theory and Applications
Impact of System Partitioning on Test Cost
IEEE Design & Test
On-line testing of scalable signal processing architectures using a software test method
ITC '98 Proceedings of the 1998 IEEE International Test Conference
RTL-Based Functional Test Generation for High Defects Coverage in Digital SOCs
ETW '00 Proceedings of the IEEE European Test Workshop
A Domain Coverage Metric for the Validation of Behavioral VHDL Descriptions
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Implicit Functionality and Multiple Branch Coverage (IFMB): a Testability Metric for RT-Level
ITC '01 Proceedings of the 2001 IEEE International Test Conference
A Validation Fault Model for Timing-Induced Functional Errors
ITC '01 Proceedings of the 2001 IEEE International Test Conference
Multi-Level Fault Injections in VHDL Descriptions: Alternative Approaches and Experiments
Journal of Electronic Testing: Theory and Applications
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test
Redundant functional faults reduction by saboteurs synthesis [logic verification]
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
A method for the evaluation of behavioral fault models
HLDVT '03 Proceedings of the Eighth IEEE International Workshop on High-Level Design Validation and Test Workshop
An efficient control-oriented coverage metric
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
A new assessment and improvement model of risk propagation in information security
International Journal of Information and Computer Security
EUC'06 Proceedings of the 2006 international conference on Embedded and Ubiquitous Computing
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