A data flow fault coverage metric for validation of behavioral HDL descriptions

• Authors: Qiushuang Zhang;Ian G. Harris
• Venue: Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
• Year: 2000

Behavioral HDL descriptions are commonly used to capture the high-level functionality of a hardware circuit for simulation and synthesis. The manual process of creating a behavioral description is error prone, so significant effort must be made to verify the correctness of behavioral descriptions. Simulation-based validation and formal verification are both techniques used to verify correctness. We investigate validation because formal verification techniques are frequently intractable for large designs. The first step toward a behavioral validation technique is the development of a validation fault coverage metric which can be used to evaluate the likelihood of design defect detection with a given test sequence.We propose a validation fault coverage metric which is based on an analysis of the control data flow description associated with the behavior. The proposed metric identifies a subset of paths through the data flow which must be traversed during testing to detect faults. The proposed metric is a tractable compromise between the statement coverage metric which requires only that each statement be executed, and the path coverage metric which requires that all data flow paths be executed. Data flow paths are identified based on the relative code locations of definitions and uses of variables which may be assigned incorrectly due to a design error. We propose an efficient method to compute all data flow paths which must be traversed, and we generate coverage results for several benchmark VHDL circuits for comparison to other approaches.