Software testing techniques (2nd ed.)
Software testing techniques (2nd ed.)
Structural Testing of Concurrent Programs
IEEE Transactions on Software Engineering
Multi-level logic optimization of FSM networks
ICCAD '95 Proceedings of the 1995 IEEE/ACM international conference on Computer-aided design
An observability-based code coverage metric for functional simulation
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
Abstraction Techniques for Validation Coverage Analysis and Test Generation
IEEE Transactions on Computers
DAC '98 Proceedings of the 35th annual Design Automation Conference
Automatic test bench generation for validation of RT-level descriptions: an industrial experience
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Switching and Finite Automata Theory: Computer Science Series
Switching and Finite Automata Theory: Computer Science Series
A data flow fault coverage metric for validation of behavioral HDL descriptions
Proceedings of the 2000 IEEE/ACM international conference on Computer-aided design
Specification and Design of Embedded Hardware-Software Systems
IEEE Design & Test
RT-Level ITC'99 Benchmarks and First ATPG Results
IEEE Design & Test
Coverage Metrics for Functional Validation of Hardware Designs
IEEE Design & Test
Software Testing and Metrics for Concurrent Computation
APSEC '96 Proceedings of the Third Asia-Pacific Software Engineering Conference
On choosing test criteria for behavioral level hardware design verification
HLDVT '00 Proceedings of the IEEE International High-Level Validation and Test Workshop (HLDVT'00)
On statistical behavior of branch coverage in testing behavioral VHDL models
HLDVT '00 Proceedings of the IEEE International High-Level Validation and Test Workshop (HLDVT'00)
Automaton: An Autonomous Coverage-Based Multiprocessor System Verification Environment
RSP '97 Proceedings of the 8th International Workshop on Rapid System Prototyping (RSP '97) Shortening the Path from Specification to Prototype
Validation Vector Grade (VVG): A New Coverage Metric for Validation and Test
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Fault Models and Test Generation for Hardware-Software Covalidation
IEEE Design & Test
An efficient control-oriented coverage metric
Proceedings of the 2005 Asia and South Pacific Design Automation Conference
Symbolic optimization of interacting controllers based on redundancy identification and removal
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Improving functional verification of embedded systems using hierarchical composition and set theory
Proceedings of the 2009 ACM symposium on Applied Computing
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We present a coverage metric which evaluates the testing of a set of interacting concurrent processes. Existing behavioral coverage metrics focus almost exclusively on the testing of individual processes. However the vast majority of practical hardware descriptions are composed of many processes which must correctly interact to implement the system. Coverage metrics which evaluate processes separately are unlikely to model the range of design errors which manifest themselves when components are integrated to build a system. A metric which models component interactions is essential to enable validation techniques to scale with growing design complexity. We describe the effectiveness of our metric and provide results to demonstrate that coverage computation using our metric is tractable.