An error simulation based approach to measure error coverage of formal properties

  • Authors:
  • P. Azzoni;A. Fedeli;F. Fummi;G. Pravadelli;U. Rossi;F. Toto

  • Affiliations:
  • Dipartimento di Informatica, Verona, Italy;STMicroelectronics, Agrate Brianza, Italy;Dipartimento di Informatica, Verona, Italy;Dipartimento di Informatica, Verona, Italy;STMicroelectronics, Agrate Brianza Italy;STMicroelectronics, Agrate Brianza Italy

  • Venue:
  • Proceedings of the 12th ACM Great Lakes symposium on VLSI
  • Year:
  • 2002

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Abstract

Many approaches have been proposed for digital system verification, either based on simulation strategies or on formal verification techniques. Both of them show advantages and drawbacks and new mixed approaches have been presented in order to improve the verification process. Specifically, the adoption of formal methods still lacks a coverage metrics to let the verification engineer get a measure of which portion of the circuit is already covered by the written properties that far and which parts still need to be addressed. The present paper describes a new simulation based methodology aimed at measuring the error coverage achieved by temporal assertions proved by model checking. The approach has been applied to the description of a protocol converter block, and some preliminary results are presented in the paper.