VHDL fault simulation for defect-oriented test and diagnosis of digital ICs
EURO-DAC '96/EURO-VHDL '96 Proceedings of the conference on European design automation
A scheme for integrated controller-datapath fault testing
DAC '97 Proceedings of the 34th annual Design Automation Conference
Modeling and simulation of real defects using fuzzy logic
Proceedings of the 37th Annual Design Automation Conference
Detecting undetectable controller faults using power analysis
DATE '00 Proceedings of the conference on Design, automation and test in Europe
Integrated test of interacting controllers and datapaths
ACM Transactions on Design Automation of Electronic Systems (TODAES)
Multiple Scan Chain Design for Two-Pattern Testing
Journal of Electronic Testing: Theory and Applications
Structural Fault Testing of Embedded Cores Using Pipelining
Journal of Electronic Testing: Theory and Applications
IC Failure Analysis: Magic, Mystery, and Science
IEEE Design & Test
IC Failure Analysis: The Importance of Test and Diagnostics
IEEE Design & Test
Modeling the Unmodelable: Algorithmic Fault Diagnosis
IEEE Design & Test
On applying non-classical defect models to automated diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Modeling the unknown! Towards model-independent fault and error diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Probabilistic mixed-model fault diagnosis
ITC '98 Proceedings of the 1998 IEEE International Test Conference
A fault diagnosis methodology for the UltraSPARC/sup TM/-I microprocessor
EDTC '97 Proceedings of the 1997 European conference on Design and Test
1.3 Parallelism in Structural Fault Testing of Embedded Cores
VTS '98 Proceedings of the 16th IEEE VLSI Test Symposium
An ILP Formulation to Optimize Test Access Mechanism in System-on-Chip Testing
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Logic Mapping on a Microprocessor
ITC '00 Proceedings of the 2000 IEEE International Test Conference
Signature Analysis for IC Diagnosis and Failure Analysis
ITC '97 Proceedings of the 1997 IEEE International Test Conference
ITC '97 Proceedings of the 1997 IEEE International Test Conference
Simulating Realistic Bridging and Crosstalk Faults in an Industrial Setting
Journal of Electronic Testing: Theory and Applications
Scalable Delay Fault BIST for Use with Low-Cost ATE
Journal of Electronic Testing: Theory and Applications
Yield Analysis of Logic Circuits
VTS '04 Proceedings of the 22nd IEEE VLSI Test Symposium
Resistive bridging fault simulation of industrial circuits
Proceedings of the conference on Design, automation and test in Europe
System-on-Chip Test Architectures: Nanometer Design for Testability
System-on-Chip Test Architectures: Nanometer Design for Testability
SUPERB: Simulator utilizing parallel evaluation of resistive bridges
ACM Transactions on Design Automation of Electronic Systems (TODAES)
| Hi-index | 0.00 |