QUIETEST: a methodology for selecting IDDQ test vectors
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Diagnosis of leakage faults with IDDQ
Journal of Electronic Testing: Theory and Applications - Special issue on IDDQ testing of VLSI circuits
Identifying defects in deep-submicron CMOS ICs
IEEE Spectrum
Fatal Defect: Chasing Killer Computer Bugs
Fatal Defect: Chasing Killer Computer Bugs
Digital Woes: Why We Should Not Depend on Software
Digital Woes: Why We Should Not Depend on Software
IDDQ Testing: Issues Present and Future
IEEE Design & Test
Defect Classes - An Overdue Paradigm for CMOS IC
Proceedings of the IEEE International Test Conference on TEST: The Next 25 Years
Intel 386TM EX Embedded Processor IDDQ Testing
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Finding Defects with Fault Models
Proceedings of the IEEE International Test Conference on Driving Down the Cost of Test
Proceedings of the IEEE International Test Conference on Test and Design Validity
IDA: A Tool for Computer-Aided Failure Analysis
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Current signatures [VLSI circuit testing]
VTS '96 Proceedings of the 14th IEEE VLSI Test Symposium
On the Adaptation of Viterbi Algorithm for Diagnosis of Multiple Bridging Faults
IEEE Transactions on Computers
Diagnosis and characterization of timing-related defects by time-dependent light emission
ITC '98 Proceedings of the 1998 IEEE International Test Conference
On the Comparison of IDDQ and IDDQ Testing
VTS '99 Proceedings of the 1999 17TH IEEE VLSI Test Symposium
Signature Analysis for IC Diagnosis and Failure Analysis
ITC '97 Proceedings of the 1997 IEEE International Test Conference
An Histogram Based Procedure for Current Testing of Active Defects
ITC '99 Proceedings of the 1999 IEEE International Test Conference
IDDQ Testing in Deep Submicron Integrated Circuits
ITC '99 Proceedings of the 1999 IEEE International Test Conference
Trojan Side-Channels: Lightweight Hardware Trojans through Side-Channel Engineering
CHES '09 Proceedings of the 11th International Workshop on Cryptographic Hardware and Embedded Systems
MOLES: malicious off-chip leakage enabled by side-channels
Proceedings of the 2009 International Conference on Computer-Aided Design
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Advancing IC and packaging technologies motivate and direct the future of failure analysis. The authors review current tools and techniques and discuss challenges and opportunities created by the industry's critical need for new diagnosis and failure analysis paradigms.