IDA: A Tool for Computer-Aided Failure Analysis

Authors:
Alan C. Noble
Affiliations:
-
Venue:
Proceedings of the IEEE International Test Conference on Discover the New World of Test and Design
Year:
1992

Citing 0
Cited 3

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A simple technique for locating gate-level faults in combinational circuits

ATS '95 Proceedings of the 4th Asian Test Symposium

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Abstract