Diagnosis and characterization of timing-related defects by time-dependent light emission

Authors:
Dan Knebel;Pia Sanda;Moyra M. C. Manus;J. A. Kash;J. C. Tsang;David P. Vallett;Leendert M. Huisman;Phil Nigh;Rick Rizzolo;Peilin Song;Franco Motika
Affiliations:
-;-;-;-;-;-;-;-;-;-;-
Venue:
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Year:
1998

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Abstract

Technological advances such as flip-chippackaging, multiple hierarchical wiring planes, andultra-high frequencies reduce the effectiveness ofconventional diagnostic techniques. It has recently beendemonstrated that light pulses emitted during circuitswitching can be used to characterize the behavior ofintegrated circuits. In this paper, a new method of circuitcharacterization using this technique is described. Anexample of the diagnosis of a timing failure caused by aresistive path to a single transistor is described.