Advanced microprocessor test strategy and methodology
IBM Journal of Research and Development - Special issue: IBM S/390 G3 and G4
Failure Diagnosis of Structured VLSI
IEEE Design & Test
IC Failure Analysis: The Importance of Test and Diagnostics
IEEE Design & Test
BIST Fault Diagnosis in Scan-Based VLSI Environments
Proceedings of the IEEE International Test Conference on Test and Design Validity
Fault Diagnosis in Scan-Based BIST
Proceedings of the IEEE International Test Conference
High volume microprocessor test escapes, an analysis of defects our tests are missing
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Diagnosis and characterization of timing-related defects by time-dependent light emission
ITC '98 Proceedings of the 1998 IEEE International Test Conference
Structured trace diagnosis for LSSD board testing—an alternative to full fault simulated diagnosis
DAC '81 Proceedings of the 18th Design Automation Conference
Fault diagnosis based on effect-cause analysis: An introduction
DAC '80 Proceedings of the 17th Design Automation Conference
A New Approach to the Fault Location of Combinational Circuits
IEEE Transactions on Computers
Fault Testing and Diagnosis in Combinational Digital Circuits
IEEE Transactions on Computers
Automated diagnostic methodology for the IBM 3081 processor complex
IBM Journal of Research and Development
Effective diagnostics through interval unloads in a BIST environment
Proceedings of the 39th annual Design Automation Conference
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This paper describes strategies and techniques used todiagnose failures in the IBM 600 MHz G5 (Generation5) CMOS microprocessor and associated cache chips.Time-to-market pressure demands quick diagnosticturnaround time while the complexity, density, cycletime, and technology issues of the hardware increasethe difficulty of diagnosis. Since G5 first silicon,intense diagnostics and physical failure analysis (PFA)have successfully identified the root cause of manyfailures, including examples of process, design, andrandom manufacturing defects. This success isattributed to the three techniques described in thispaper. For each technique, an example is presented todemonstrate its effectiveness.